Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T09:48:49.984Z Has data issue: false hasContentIssue false
  • English
  • Français

Semiquantitative XRD analysis with the aid of reference intensity ratio estimates

Published online by Cambridge University Press:  10 January 2013

Briant L. Davis
Briant L. Davis
Affiliation:
Davis Consulting Group, 4022 Helen Court, Rapid City, South Dakota 57702
Get access Rights & Permissions [Opens in a new window]

Abstract

Estimation of reference intensity ratios (ki or RIR) can be made on the basis of an atomic scattering function. Tests of regression equations for 50 compounds that predict an approximate reference intensity ratio from the easily computed scattering function have shown usefulness in multicomponent semiquantitative X-ray diffraction analysis. The method is best applied whenever only one or two minor components of a multicomponent sample have no readily measurable or calculable ki values and must be estimated. Where the difference between observed and predicted constants is large, these tests show that the ratios of true- to test-weight fractions are proportional to the corresponding ki ratios. The largest absolute errors occur whenever the ki must be predicted for components with medium weight fraction values. Estimation of ki for components of less than 10 weight percent results in only small errors in both predicted component and the other components of the sample. Where more than two components require predicted ki in a given sample, unacceptable errors for all components may result.

Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 3 , September 1998 , pp. 185 - 187
Copyright
Copyright © Cambridge University Press 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Chung, F. (1974). “A new X-ray diffraction method for quantitative multicomponent analysis,” Adv. X-Ray Anal. 17, 106–115.Google Scholar
Davis, B. L. (1988). “Reference intensity method of quantitative X-ray diffraction analysis” (Davis Consulting Group, 4022 Helen Court, Rapid City, SD, 57702), 233 pp.Google Scholar
Davis, B. L. (1995). “RIMPAC—Reference intensity method, X-ray diffraction quantitative analysis application software” (Davis Consulting Group, 4022 Helen Court, Rapid City, SD 57702).Google Scholar
Davis, B. L., and Walawender, M. J. (1982). “Quantitative mineralogical analysis of granitoid rocks: a comparison of X-ray and optical techniques,” Am. Mineral. 67, 1135–1143.Google Scholar
Davis, B. L., Kath, R., and Spilde, M. (1990). “The reference intensity ratio: Its measurement and significance,” Powder Diffr. 5, 76–78.CrossRefGoogle Scholar
James, R. W. (1948). The Crystalline State, Vol. II: The Optical Principles of the Diffraction of X-rays (George Bell, London).Google Scholar