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Microabsorption Correction of X-Ray Intensities Diffracted by Multiphase Powder Specimens

Published online by Cambridge University Press:  10 January 2013

H. Hermann  and
M. Ermrich
H. Hermann
Affiliation:
Central Institute of Solid State Physics and Materials Research Dresden, Academy of Sciences of the GDR, Helmholtzstr. 20, Dresden, DDR-8027, E., Germany
M. Ermrich
Affiliation:
Central Institute of Solid State Physics and Materials Research Dresden, Academy of Sciences of the GDR, Helmholtzstr. 20, Dresden, DDR-8027, E., Germany
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Abstract

The absorption of X-rays in a heterogeneous material depends on the linear absorption coefficients and volume fractions of the components, and on die geometrical peculiarities of their distribution. The latter is called the microabsorption effect, it can be separated into a bulk and a surface contribution. Within the framework of a well-defined stochastic structure model, the bulk contribution to the microabsorption is calculated for arbitrary random multiphase systems in terms of dependence on volume fractions and mean chord lengths of particles. Expressions are derived which are suitable for eliminating the experimental errors of scattering intensities caused by the bulk contribution of microabsorption.

If only one wavelengtii of radiation is used, the mean chord lengths of the phases of the sample must be determined by other experimental techniques. A method is proposed to overcome this difficulty by using two or more wavelengths of radiation; this correction procedure works without the knowledge of the particle sizes of the phases.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 4 , December 1989 , pp. 189 - 195
Copyright
Copyright © Cambridge University Press 1989

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References

Brindley, G.W. (1945). Philos. Mag. 36, 347–369.CrossRefGoogle Scholar
Gonzales, C.R., Roque-Malherbe, R. & Shchukin, E.D. (1987). J. Mater. Sci. Lett. 6, 604–606.CrossRefGoogle Scholar
Harrison, R.J. & Paskin, A. (1964). Acta Crystallogr. 17, 325–331.CrossRefGoogle Scholar
Hartmann, U. (1972). Härterei-Techn. Mitt. 27, 251–260.Google Scholar
Hermann, H. (1983). Studia Biophysica 98, 41–46.Google Scholar
Hermann, H. & Ermrich, M. (1987). Acta Crystallogr., Sect. A 43, 401–405.CrossRefGoogle Scholar
Klug, H.P. & Alexander, L.E. (1974) X-Ray Diffraction Procedures 2ndEd., Wiley: InterscienceGoogle Scholar
Leroux, J., Lennox, D. & Kay, K. (1953). Anal. Chem. 25, 740–743.CrossRefGoogle Scholar
Materon, G. (1975). Random Sets and Integral Geometry. New York: J. Wiley & Sons.Google Scholar
Otto, J. (1984). Z. Kristallogr. 167, 55–64.CrossRefGoogle Scholar
Serra, J.P. (1982). Image Analysis and Mathematical Morphology. London: Academic PressGoogle Scholar
Sonntag, U., Stoyan, D. & Hermann, H. (1981). Phys. Status Solidi A 68, 281–288.CrossRefGoogle Scholar
Suortti, P. (1972). J. Appl. Crystallgr. 5, 325–331.CrossRefGoogle Scholar
Stoyan, D., Kendall, W.S. & Mecke, J. (1987). Stochastic Geometry and Its Applications. Chichester: Wiley.Google Scholar
Trucano, P. & Batterman, B.W. (1970). J. Appl. Phys. 41, 3949–3953.CrossRefGoogle Scholar