Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-26T08:11:05.960Z Has data issue: false hasContentIssue false
  • English
  • Français

A Method for Quantitative X-Ray Phase Analysis Without Standards

Published online by Cambridge University Press:  19 May 2016

Hongying Wang
Hongying Wang*
Affiliation:
Department of Materials, Shanghai University of Science and Technology, Shanghai, China
Get access Rights & Permissions [Opens in a new window]

Abstract

An expanded X-ray quantitative phase analysis method is presented. It is an extension of the method without standards. In order to get the method applied more extensively, there is a discussion at the end of this paper of the suitability of samples.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 3 , September 1988 , pp. 165 - 167
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Alexander, L. E. & Klug, H. P. (1948). Anal. Chem. 20, 886.Google Scholar
Gongda, Yao & Changlin, Kuo (1985). J. Phys. (Chinese) 11, 1461.Google Scholar
Zevin, L. S. (1977). J. Appl. Crystallogr. 10, 147.Google Scholar
Zevin, L. S. (1979). J. Appl. Crystallogr. 12, 582.Google Scholar