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Improved crystallographic data for graphite

Published online by Cambridge University Press:  06 March 2012

J. Y. Howe ,
C. J. Rawn ,
L. E. Jones  and
H. Ow
J. Y. Howe
Affiliation:
School of Ceramic Engineering and Materials Science, Alfred University, Alfred, New York 14802
C. J. Rawn
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
L. E. Jones
Affiliation:
School of Ceramic Engineering and Materials Science, Alfred University, Alfred, New York 14802
H. Ow
Affiliation:
School of Ceramic Engineering and Materials Science, Alfred University, Alfred, New York 14802
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Abstract

Powder diffraction pattern of SP-1 graphite has been obtained using synchrotron X-ray diffraction. Unit cell dimensions were calculated using a least-squares analysis that refined to a |Δ2θ°| of no more than 0.007. A hexagonal cell was determined with a space group of P63/mmc (194), a=2.4617(2) and c=6.7106 (4) Å. The Smith/Synder figure of merit is 167 based upon 11 peaks, which indicates that the quality of this data set is superior to the existing PDF card for graphite, 41-1487. It is also emphasized that the interlayer spacing of graphite should be 3.355(1) Å. Using GAS and EXPGUI codes, a new set of calculated powder diffraction data based upon the interlayer spacing of 3.555 Å is generated. A comparison with the current calculated card, 75-1621, has also been made.

Keywords

graphitepowder diffractionsynchrotron X-ray
Type
New Diffraction Data
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 150 - 154
Copyright
Copyright © Cambridge University Press 2005

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