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Identification and Quantification of Unknown Component Phases in Powder Samples by X-Ray Diffractometry

Published online by Cambridge University Press:  10 January 2013

Masanao Kato ,
Sinzo Fujii ,
Takuji Ui  and
Eiichi Asada
Masanao Kato
Affiliation:
Department of Materials Science, Toyohashi University of Technology, Toyohashi, 440, Japan
Sinzo Fujii
Affiliation:
Department of Materials Science, Toyohashi University of Technology, Toyohashi, 440, Japan
Takuji Ui
Affiliation:
Department of Materials Science, Toyohashi University of Technology, Toyohashi, 440, Japan
Eiichi Asada
Affiliation:
Department of Materials Science, Toyohashi University of Technology, Toyohashi, 440, Japan
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Abstract

A method of analysis for X-ray diffractometry is proposed for determining the number and the concentrations of phases in a series of samples of the same multiphase system. This method can be used when n samples containing N phases, where N<n, with different concentrations are given or prepared from a given sample.

The method of principal component analysis was applied to the determination of the number of individual phases in multiphase mixtures. A quantification method using the intensity ratio to an arbitrary chosen standard mixture, which is also one of the mixtures to be analyzed, is proposed.

In this study, we examined the validity of this method for X-ray diffractograms of two and three component systems. It is shown that the values determined by the present method are in good agreement with the prepared concentrations of the samples.

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 1 , March 1990 , pp. 33 - 35
Copyright
Copyright © Cambridge University Press1990

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References

Copeland, L.E.and Bragg, R.H.(1958) Anal. Chem., 30, 196.Google Scholar
Fiala, J.(1980) Anal. Chem., 52, 1300.Google Scholar
Klug, H.P., and Alexander, L.E.(1954) X-ray Diffraction Procedure for Polycrystalline and Amorphous Materials, John Wiley & Sons.Google Scholar
Nichols, M.C., Smith, D.K., and Johnson, Q.(1982) J. Appl. Crystallogr. 18, 8.CrossRefGoogle Scholar
Zevin, L. S.(1977) J. Appl. Crystallogr. 10, 147.Google Scholar