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High-precision parallel-beam X-ray system for high-temperature diffraction studies

Published online by Cambridge University Press:  05 March 2012

Toru Mitsunaga ,
Mari Saigo  and
Go Fujinawa
Toru Mitsunaga
Affiliation:
Application Laboratory, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan
Mari Saigo
Affiliation:
Application Laboratory, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan
Go Fujinawa
Affiliation:
Application Laboratory, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan
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Abstract

A recently developed Rigaku parallel-beam X-ray diffraction system equipped with a parabolic graded-multilayer mirror in the incident beam and a parallel-slits analyzer in the diffracted beam was used for precision high-temperature diffraction studies. The lattice parameters a and c of α-Al2O3 at room temperature and up to 1473 K were determined with precision in the range of 0.6–7.3×10−5. The thermal expansion coefficients for a and c agreed with literature values to better than 3%. The system was used successfully also to determine the Debye characteristic temperature of Si and to study structural phase transition of LaCoO3 from rhombohedral at room temperature to cubic at 1700 K.

Keywords

parallel beamhigh-temperature diffractionthermal expansionthermal vibrationphase transition
Type
Technical Articles
Information
Powder Diffraction , Volume 17 , Issue 3 , September 2002 , pp. 173 - 177
Copyright
Copyright © Cambridge University Press 2002

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