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F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters

Published online by Cambridge University Press:  20 May 2016

W. T. Elam ,
R. B. Shen ,
B. Scruggs  and
J. Nicolosi
W. T. Elam
Affiliation:
EDAX, Inc., Mahwah, NJ
R. B. Shen
Affiliation:
EDAX, Inc., Mahwah, NJ
B. Scruggs
Affiliation:
EDAX, Inc., Mahwah, NJ
J. Nicolosi
Affiliation:
EDAX, Inc., Mahwah, NJ
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 196
Copyright
Copyright © Cambridge University Press 2004

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