Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T03:26:46.011Z Has data issue: false hasContentIssue false

D-78 Elastic Properties of Nano-Structured Thin Films: Characterization and Modeling

Published online by Cambridge University Press:  20 May 2016

G. Geandier
Affiliation:
Universite´ de Poitiers, Futuroscope, France
P.-O. Renault
Affiliation:
Universite´ de Poitiers, Futuroscope, France
Ph. Goudeau
Affiliation:
Universite´ de Poitiers, Futuroscope, France
E. Le Bourhis
Affiliation:
Universite´ de Poitiers, Futuroscope, France
P. Villain
Affiliation:
Universite´ de Poitiers, Futuroscope, France
B. Girault
Affiliation:
Universite´ de Poitiers, Futuroscope, France
O. Castelnau
Affiliation:
Institut Galile´e, Villetaneuse, France
R. Chiron
Affiliation:
Institut Galile´e, Villetaneuse, France
R. Randriamazaoro
Affiliation:
Institut Galile´e, Villetaneuse, France
D. Thiaudie`re
Affiliation:
Synchrotron SOLEIL-L'Orme des Merisiers, Gif-sur-Yvette, France

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)