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D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures

Published online by Cambridge University Press:  20 May 2016

A. Ulyanenkov ,
A. Benediktovitch ,
I. Feranchuk ,
B. He  and
H. Ress
A. Ulyanenkov
Affiliation:
Bruker AXS GmbH, Karlsruhe, Germany
A. Benediktovitch
Affiliation:
Belarussian State University, Minsk, Belarus
I. Feranchuk
Affiliation:
Belarussian State University, Minsk, Belarus
B. He
Affiliation:
Bruker AXS, Inc., Madison, WI
H. Ress
Affiliation:
Bruker AXS, Inc., Madison, WI
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 171
Copyright
Copyright © Cambridge University Press 2009

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