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D-34 Fundamental Parameters Fitting of XRPD Data Measured Using Multilayer Optics

Published online by Cambridge University Press:  20 May 2016

S. T. Misture  and
M. D. Dolan
S. T. Misture
Affiliation:
NYS College of Ceramics at Alfred University, Alfred, NY
M. D. Dolan
Affiliation:
NYS College of Ceramics at Alfred University, Alfred, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 204
Copyright
Copyright © Cambridge University Press 2004

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