This special June issue of Powder Diffraction is comprised of selected papers presented at the 2008 57th Annual Denver X-ray Conference (DXC). At DXC 38 special sessions took place, which covered the following areas:
New Developments in XRD & XRF Instrumentation, Analysis of Nanomaterials, Cultural Heritage, Industrial Applications, X-ray Microimaging, Microbeam X-ray Analysis, Thin Films, High Temperature In situ Analysis, Small Angle Scattering, Fusion & Industrial Applications of XRF, Regulatory Applications, Trace Analysis and Quantitative Analysis.
As part of the Denver X-ray Conference, proceedings are published and from these proceedings selected papers covering both XRD and XRF were chosen for publication in Powder Diffraction. This issue of Powder Diffraction will provide the reader with the opportunity to learn about current issues in a variety of materials characterization applications.
The talents of many people are required to make this special issue possible. Besides the authors themselves, we want to thank the manuscript reviewers and the staff of Powder Diffraction, particularly the managing editor Nicole Ernst as well as the DXC conference coordinator Denise Flaherty for all of their hard work in making this publication a reality. We hope you enjoy this publication and we look forward to seeing you at the 2009 Denver X-ray Conference in Colorado Springs, Colorado 27–31 July 2009.
