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X-Ray Microbeam Quantification of Grain Subdivision Accompanying Large Deformations of Copper

Published online by Cambridge University Press:  10 February 2011

G. C. Butler ,
A. Guvenilir ,
D. L. McDowell  and
S. R. Stock
G. C. Butler
Affiliation:
George W. Woodruff School of Mechanical Engineering
A. Guvenilir
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
D. L. McDowell
Affiliation:
Mechanical Properties Research Laboratory George W. Woodruff School of Mechanical Engineering School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
S. R. Stock
Affiliation:
Mechanical Properties Research Laboratory School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245
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Abstract

Polychromatic synchrotron x-ray microbeams offer a very efficient alternative to electron beam methods for quantifying the amount and character of grain subdivision accompanying large deformations. With a 0.01 mm diameter collimator, bending magnet radiation from a 3.0 GeV source and image storage plates, samples of copper with thicknesses greater than 0.1 mm have been studied. Results from an as-received sample and a sample deformed to 100% torsion are compared and illustrate how efficiently grain subdivision can be quantified with polychromatic microbeam diffraction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 43
Copyright
Copyright © Materials Research Society 1998

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