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Visible Light-Emitting Diodes Grown by Plasma Assisted Molecular Beam Epitaxy on Hydride Vapor-Phase Epitaxy GaN Templates and the Development of Dichromatic (Phosphorless) White LEDs

Published online by Cambridge University Press:  01 February 2011

Jasper S. Cabalu ,
Adrian Williams ,
Tai-Chou P. Chen ,
Ryan France  and
Theodore D. Moustakas
Jasper S. Cabalu
Affiliation:
[email protected], Boston University, 8 Saint Mary's St., Boston, MA, 02215, United States
Adrian Williams
Affiliation:
[email protected], Boston University
Tai-Chou P. Chen
Affiliation:
[email protected], Boston University
Ryan France
Affiliation:
[email protected], Boston University
Theodore D. Moustakas
Affiliation:
[email protected], Boston University
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Abstract

Much of the work on III-Nitride-based LEDs that has been published and applied commercially has been done using metal-organic chemical vapor deposition (MOCVD) as a method of film growth. We report on the growth and fabrication of visible light emitting diodes, by combining hydride vapor-phase epitaxy (HVPE) and rf plasma-assisted MBE (PAMBE) methods. Thick (∼7 μm to 10 μm) HVPE n+-GaN smooth and textured templates, were used as substrates for the growth of LED structures by rf-PAMBE. The active regions of the LED structures, which consist of InGaN/GaN MQWs, were grown using the pulsed nitrogen plasma technique leading to abrupt well and barrier interfaces as confirmed by x-ray diffraction (XRD) measurements. Using this method, we obtained InGaN/GaN MQWs whose room temperature photoluminescence (PL) spectra have a full width at half maximum (FWHM) of 12 nm (105 meV). Visible LEDs on smooth GaN templates emitting in the blue to green were produced with EL spectrum FWHM as narrow as 27 nm. On the other hand, white LEDs without the use of phosphor have been produced utilizing textured MQWs as the active region, a phenomenon we initially attribute to different incorporation of In on the different QW-planes. The growth and fabrication of these devices was preceded by detailed growth and doping studies of the various layers of the LED structure. These include detailed nucleation studies on (0001) sapphire substrates as well as identification of kinetic factors which lead to good crystalline-quality InGaN alloys and InGaN/GaN MQWs.

Keywords

molecular beam epitaxy (MBE)vapor phase epitaxy (VPE)nitride
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 892 , 2005 , 0892-FF12-04
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

1. Grandjean, N., et al. , Electron. Lett. 33, 2156 (1997).CrossRefGoogle Scholar
2. Hooper, S. E., et al. , Electron. Lett. 40, 33 (2004).Google Scholar
3. Skierbiszewski, C., et al. , Appl. Phys. Lett. 86, 011114 (2005).CrossRefGoogle Scholar
4. Waltereit, P., et al. , Appl. Phys. Lett. 84, 2748 (2004).CrossRefGoogle Scholar
5. Moustakas, T. D., Lei, T., and Molnar, R. J., Physica B 185, 36 (1993).CrossRefGoogle Scholar
6. Bhattacharyya, A., et al. , Appl. Phys. Lett. 85, 4956 (2004).CrossRefGoogle Scholar
7. Singh, R., Doppalapudi, D., and Moustakas, T. D., Appl. Phys. Lett. 69, 2388 (1996).Google Scholar
8. Brandt, O., et al. , Appl. Phys. Lett. 83, 90 (2003).CrossRefGoogle Scholar
9. Nakamura, S., et al. , The Blue Laser Diode: The Complete Story, Second Edition (Springer, Berlin, 2000).CrossRefGoogle Scholar
10. Johnson, M. A. L., et al. , J. Vac. Sci. Technol. B 16, 1282 (1998).Google Scholar
11. Kushi, K., et al. , at. Sci Eng. B 59, 65 (1999).CrossRefGoogle Scholar
11. Waltereit, P., et al. , Appl. Phys. Lett. 84, 2748 (2004).CrossRefGoogle Scholar
12. Cabalu, J. S., et al. , Proc. SPIE Int. Soc. Opt. Eng. 5732, 185 (2005).Google Scholar
13. Eliashevich, I., et al. , Proc. SPIE 3621, 28 (1999).CrossRefGoogle Scholar