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Ultrafast Optical Measurements of Acoustic Phonon Attenuation in Amorphous and Nanocrystalline Silicon
Published online by Cambridge University Press: 22 July 2013
Abstract
We have measured the attenuation of longitudinal acoustic waves in a series of amorphous and nanocrystalline silicon films using picosecond ultrasonics. We determined the attenuation of amorphous Si to be lower than what is predicted by theories based on anharmonic interactions of the ultrasound wave with localized phonons or extended resonant modes. We determined the attenuation of nanocrystalline Si to be nearly one order of magnitude higher than amorphous Si.
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- Information
- MRS Online Proceedings Library (OPL) , Volume 1536: Symposium A – Film Silicon Science and Technology , 2013 , pp. 147 - 153
- Copyright
- Copyright © Materials Research Society 2013
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