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Triple-probe Atomic Force Microscope: Measuring a carbon nanotube/DNA MIS-FET

Published online by Cambridge University Press:  11 February 2011

Kei Shimotani ,
Hiroyuki Watanabe ,
Chikara Manabe ,
Taishi Shigematsu  and
Masaaki Shimizu
Kei Shimotani
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Hiroyuki Watanabe
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Chikara Manabe
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Taishi Shigematsu
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Masaaki Shimizu
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
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Abstract

We have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of “Nanotweezers” and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G14.3
Copyright
Copyright © Materials Research Society 2003

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References

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