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Transformation of carbon onions under high pressure and shear deformation in diamond anvil cell

Published online by Cambridge University Press:  23 August 2012

A.N. Kirichenko
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
A.K. Aseev
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
V.N. Denisov
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation. Institute of spectroscopy RAS, 5 Fizicheskaya street, Troitsk, Moscow region, 142190 Russian Federation.
I. Perezhogin
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
B.A. Kulnitskiy
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
A.A. Nuzhdin
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
V.D. Blank
Affiliation:
FSBI TISNCM, 7a Centralnaya street, Troitsk, Moscow region, 142190, Russian Federation.
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Abstract

The carbon onions have been treated in a shear diamond anvil cell under pressure up to 43 GPa and shear deformation up to 2000. The recovered samples have been investigated by the Transmission Electron Microscopy (TEM) and the UV and visible Raman spectroscopy. The carbon onions was stable at pressure up to 30 GPa and 400 shear. Bigger shear deformation at pressures exceeding 30 GPa leads to the amorphous carbon. At 43 GPa shear deformation leads to transformation of onions to DLC.

Type
Articles
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Mao, W. L., Mao, H. K., Eng, P. J., Trainor, T. P., Newville, M., Kao, C. C., Heinz, D. L., Shu, J. F., Meng, Y., and Hemley, R. J., Science 302, 425(2003).Google Scholar
2. Blank, V. D., Denisov, V. N., Kiricheko, A. N., Kulnitskiy, B., Martushov, S. Y., Mavrin, B. N., and Perezhogin, I. A., Nanotechnology 18, 345601(2007).Google Scholar
3. Merlen, A., Bendiab, N., Toulemonde, P., Aouizerat, A., San Miguel, A., Sauvajol, J. L., Montagnac, G., and Cardon, H., Phys. Rev. B 72, 035409(2005).Google Scholar
4. Choi, I., Yu, P. Y., Tangney, P., and Louie, S. G., Phys. Status Solidi B 244, 121 (2007).Google Scholar
5. Snoke, D. W., Raptis, Y. S., and Syassen, K., Phys. Rev. B 45, 14419 (1992).Google Scholar
6. Ravindran, T. R. and Badding, J. V., Solid State Commun. 121, 391 (2002).Google Scholar
7. Arvanitidis, J., Christofilos, D., Papagelis, K., Andrikopoulos, K. S., Takenobu, T., Iwasa, Y., Kataura, H., Ves, S., and Kourouklis, G. A., Phys. Rev. B 71, 125404 (2005).Google Scholar
8. Blank, V.D., Denisov, V.N., Kirichenko, A.N., Lvova, N.A., Martyushov, S.Yu., Mavrin, B.N., Popova, D.M., Popov, M.Yu., Tat`yanin, E.V., Zakhidov, A, Phys. B: Cond. Mat., 382, .58 (2006).Google Scholar
9. Guo, J. J., Liu, G. H., Wang, X. M., Fujita, T., Xu, B. S., and Chen, M. W., APPL. PHYS. LETTERS 95, 051920(2009).Google Scholar
10. Obraztsova, E.D., Fujii, M., Hayashi, S., Kuznetsov, V.L., Butenko, Yu.V. and Chuvilin, A.L., Carbon, 36, 821826 (1998).Google Scholar
11. Bacsa, W.S., de Heer, W.A., Ugarte, D., and Chatelain, A., Chem. Phys. Letters, 211, I346352 (1993).Google Scholar
12. Roy, D., Chhowalla, Manish, Wang, H., Sano, N., Alexandrou, I., Clyne, T.W., Amaratunga, G.A.J., Chem. Phys. Letters, 373, 5256 (2003).Google Scholar
13. Tuinstra, F., Koening, J.L., J. Chem. Phys. 53, 1126 (1970).Google Scholar
14. Ferrari, Andrea Carlo and Robertson, John, Phil. Trans. R. Soc. Lond. A 362, 24772512 (2004).Google Scholar
15. Prawer, S., Nugent, K.W., Lifshitz, Y., Lempert, G.D., Grossman, E., Kulik, J., Avigal, I., Kalish, R.. Diamond and Related Materials 5, 433 (1996).Google Scholar