Hostname: page-component-745bb68f8f-b95js Total loading time: 0 Render date: 2025-01-27T02:32:21.189Z Has data issue: false hasContentIssue false
  • English
  • Français

Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 February 2011

Klaus van Benthem ,
Yiping Peng  and
Stephen J. Pennycook
Klaus van Benthem
Affiliation:
Oak Ridge National Laboratory, One Bethel Valley Road, Oak Ridge, TN 37831–6031, USA
Yiping Peng
Affiliation:
Oak Ridge National Laboratory, One Bethel Valley Road, Oak Ridge, TN 37831–6031, USA
Stephen J. Pennycook
Affiliation:
Oak Ridge National Laboratory, One Bethel Valley Road, Oak Ridge, TN 37831–6031, USA
Get access

Abstract

In aberration corrected scanning transmission electron microscopy, the depth of focus is of the order of a few nanometers, so that the three-dimensional shape of nanocrystals could so far not be determined with atomic resolution. Here we show that with the assistance of image simulations it is possible to achieve atomic-scale information in the depth direction by analyzing a through-focal series where the number of atoms in most columns can be determined by Z-contrast simulations. The error in this analysis is about two atoms in the thickest regions, and less in thinner regions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 839: Symposium P – Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry, and Structure , 2004 , P1.3.1
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. de Rosier, D.J., Klug, A. Reconstruction of Three Dimensional Structures from Electon Micrographs. Nature 217, 130–134 (1968).Google Scholar
2. Midgley, P.A., Weyland, M. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 96, 413–431 (2003).Google Scholar
3. Koster, A.J., Ziese, U., Verkleij, A.J., Janssen, A.H., de Jong, K.P. Three-Dimensional Transmission Electron Microscopy: A Novel Imaging and Characterization Technique with Nanometer Scale Resolution for Materials Science. J. Phys. Chem. B 104, 9368–9370 (2000).Google Scholar
4. Miller, M.K., Atom-Probe Tomography: Analysis at the Atomic level, Kluwer Academic/Plenum Press, New York (2000).Google Scholar
5. van Benthem, K. et al., submitted to Nature (2004)Google Scholar
6. http://www.2spi.com/catalog/standards/othertem7.shtml Google Scholar
7. Hÿtch, M.J., Stobbs, W.M., Ultramicroscopy 53 (1994) 191.Google Scholar