Article contents
To Bias or Not to Bias? An “How-To” Guide for Spectral Response Measurements of Thin Film Multi-Junction Photovoltaic Modules
Published online by Cambridge University Press: 10 May 2012
Abstract
Current-matching between junctions in a multi-junction photovoltaic device is fundamental for its performance prediction: the measurement of the spectral response of each junction provides a valuable information to optimize the device performance. Various aspects make spectral response measurements of such devices particularly challenging. In this work these aspects are analysed theoretically and guidelines to avoid their impact in the experimental practice are given.
- Type
- Articles
- Information
- Copyright
- Copyright © Materials Research Society 2012
References
REFERENCES
- 3
- Cited by