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Time-resolved Ellipsometry to Study Extreme Non-equilibrium Electron Dynamics in Nanostructured Semiconductors

Published online by Cambridge University Press:  11 July 2012

T. W. Roger  and
A. Kaplan
T. W. Roger
Affiliation:
Nanoscale Physics Research Laboratory, University of Birmingham, Edgbaston Park Road, Birmingham, B15 2TT
A. Kaplan
Affiliation:
Nanoscale Physics Research Laboratory, University of Birmingham, Edgbaston Park Road, Birmingham, B15 2TT
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Abstract

We present a femtosecond pump-probe ellipsometer operating over a spectral range of 1.4 – 1.7 eV with a ∼50fs time resolution. The calibration and preliminary findings of the setup are discussed. We tested the apparatus on bulk crystalline silicon (not shown here) and on silicon nanocrystals embedded in an amorphous silicon phase. The ellipsometric angles (ψ, Δ) were determined as a function of time and wavelength. The results suggest that a simple Drude model of free carrier absorption is not sufficient to explain the findings.

Keywords

nanoscaleSithin film
Type
Plasmonics
Information
MRS Online Proceedings Library (OPL) , Volume 1426: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology—2012 , 2012 , pp. 395 - 400
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

Choo, H. R., Hu, X. F., Downer, M. C. & Kesan, V. P., Appl. Phys. Lett. 2, 1507–1509 (1993).CrossRefGoogle Scholar
Min, C., Cahill, D. G., & Granick, S., Rev. Sci. Instrum. 81, 1–7 (2010).CrossRefGoogle Scholar
Sokolowski-Tinten, K., Phys. Rev. B. 61, 2643–2650 (2000).CrossRefGoogle Scholar
Lioudakis, E., Othonos, A., Nassiopoulou, A. G., Lioutas, C. B. & Frangis, N., Appl. Phys. Lett. 90, 191114 (2007).CrossRefGoogle Scholar
Hu, L. & Chen, G., Nano Lett. 7, 3249–3252 (2007).CrossRefGoogle Scholar
Shah, A., et al. ., Sol. Energy Mat. Sol. Cells. 78, 469–491 (2003).CrossRefGoogle Scholar
Sjodin, T., Petek, H., & Dai, H., Phys. Rev. Lett. 81, 1–4 (1998).CrossRefGoogle Scholar
Fujiwara, H., Spectroscopic Ellipsometry. (John Wiley & Sons: Hoboken, 2003), p. 81.Google Scholar
Esser, A., Phys. Rev. B. 41, 2879–2884 (1990).CrossRefGoogle Scholar
Lenner, M., Kaplan, A., Huchon, C. & Palmer, R. E., Phys. Rev. B. 79, 1–11 (2009).CrossRefGoogle Scholar
Barreto, J., Roger, T. & Kaplan, A., Appl. Phys. Lett. 24, 241906 (2012).CrossRefGoogle Scholar
Petek, H., & Ogawa, S.. Prog. Surf. Sci. 56, 239–310 (1998).CrossRefGoogle Scholar
Boer, J. H., Kroesen, G. M. W. & Hoog, F. J. D., Meas. Sci. Technol. 8, 484–492 (1997).CrossRefGoogle Scholar
Ghezzo, M., Brit. J. Appl. Phys. 2(2), 1483–1485 (1969).Google Scholar
Jones, R. C., J. Opt. Soc. Am. 31, 488–493 (1941).CrossRefGoogle Scholar