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Thermal Grooving in Single versus Multilayer Thin Films

Published online by Cambridge University Press:  01 February 2011

Peter M. Anderson ,
Jue Wang  and
Sridhar Narayanaswamy
Peter M. Anderson
Affiliation:
Dept of Materials Science and Engineering, Ohio State University, 2041 College Rd., Columbus, OH 43210
Jue Wang
Affiliation:
Dept of Materials Science and Engineering, Ohio State University, 2041 College Rd., Columbus, OH 43210
Sridhar Narayanaswamy
Affiliation:
Dept of Materials Science and Engineering, Ohio State University, 2041 College Rd., Columbus, OH 43210
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Abstract

A 2D analytic result is presented for the penetration distance P of grain boundary grooves as a function of time t during heating and straining of polycrystalline multilayer thin films with immiscible phases. These grooves can ultimately pinch off individual layers. The result shows that P ∼ t0.25 initially and P ∼ t at longer time. This new analysis contrasts single- versus multilayer thin film response.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 854: Symposium U – Stability of Thin Films and Nanostructures , 2004 , U7.4
Copyright
Copyright © Materials Research Society 2005

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References

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