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Thermal Analysis and Structural Design of Phase Change Random Access Memory
Published online by Cambridge University Press: 01 February 2011
Abstract
A thermal modeling based on Finite Element Method (FEM) was used to simulate Phase Change Random Access Memory (PCRAM) cells. The factors affecting temperature distribution of a PCRAM cell structure such as geometry, device structure and the properties of the individual materials were investigated. The results of the analysis provided the fundamental design of a novel cell structure which has a better performance and reliability.
Keywords
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 918: Symposium H – Chalcogenide Alloys for Reconfigurable Electronics , 2006 , 0918-H05-02-G06-02
- Copyright
- Copyright © Materials Research Society 2006
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