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Published online by Cambridge University Press: 01 February 2011
Experimental techniques for SPM imaging and spectroscopy of low-dimensional systems have significantly progressed in recent years. At the same time, new simulation methods and computational techniques have allowed the development of a theoretical basis to the interpretation and understanding of the measurements. In this contribution, we concisely review two state-of-the-art modeling methods for scanning probe microscopy, as applied to carbon nanostructures.