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Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

Published online by Cambridge University Press:  18 March 2011

Teresa Puig ,
Anna Puig-Molina ,
Narcís Mestres ,
Harm Van Seijen ,
Francesc Alsina ,
Juan C. González ,
Xavier Obradors ,
Heinz Graafsma ,
Alexander Usoskin  and
Herbert C. Freyhardt
Teresa Puig
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Anna Puig-Molina
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Narcís Mestres
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Harm Van Seijen
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Francesc Alsina
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Juan C. González
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Xavier Obradors
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Heinz Graafsma
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Alexander Usoskin
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
Herbert C. Freyhardt
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
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Abstract

Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 659: Symposium II – High-Temperature Superconductors-Crystal Chemistry, Processing & Properties , 2000 , II5.6
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

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