Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-28T06:35:35.161Z Has data issue: false hasContentIssue false
  • English
  • Français

Synthesizing and Subsequent Annealing of Si-based Thermoelectric Material Ba8AuxSi46-x Clathrates

Published online by Cambridge University Press:  25 October 2012

Bin Liu ,
Makoto Saisho ,
Yuya Nagatomo ,
Mikihito Tajiri ,
Yusuke Nakakohara ,
Osamu Furukimi ,
Ryo Teranishi  and
Shinji Munetoh
Bin Liu
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Makoto Saisho
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Yuya Nagatomo
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Mikihito Tajiri
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Yusuke Nakakohara
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Osamu Furukimi
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Ryo Teranishi
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Shinji Munetoh
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka, Japan.
Get access

Abstract

We prepared the type-I Ba8AuxSi46-x (x=5.5, 5.4 and 5.33) clathrates with p-type conduction by arc-melting and subsequent annealing. The Seebeck coefficients of all as-synthesized samples were negative. After annealing, in the case of x=5.4 and 5.5, the Seebeck coefficients changed to positive, and in the case of x=5.33, this value was negative for the annealed sample. The chemical composition revealed that Au content in the Ba8AuxSi46-x clathrates increased after the annealing process. The backscattered electron images showed that there were many Au-excess regions which were not clathrate structure in the as-synthesized samples, and these regions decreased and even disappeared after the annealing process. The disappearing of Au-excess regions can be explained by the diffusion of Au atoms from the Au-excess regions into the clathrates. Based on these results, annealing treatment can be used to tune the carrier conduction by controlling the content of Au for type-I Ba8AuxSi46-xclathrates.

Keywords

annealingclathratesthermoelectric
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1456: Symposium JJ – Nanoscale Thermoelectrics 2012—Materials and Transport Phenomena , 2012 , mrss12-1456-jj03-05
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Tritt, T.M., Science 283, 804 (1999).10.1126/science.283.5403.804CrossRefGoogle Scholar
Slack, G., in CRC Handbook of Thermoelectrics, edited by Rove, D.M. (CRC Press, Boca Raton, 1995), Vol. D, Pt. 34, pp. 407 – 440.Google Scholar
Cohn, J.L., Nolas, G.S., Fessatidis, V., Metcalf, T.H., Slack, G.A., Phys. Rev. Lett. 779, 82 (1999).Google Scholar
Leoni, S., Carrillo-Cabrera, W. and Grin, Y., J. Alloys Compd. 113, 350 (2003).Google Scholar
Nenghabi, E.N. and Myles, C.W., Phys. Rev. B 195202, 78 (2008).Google Scholar
Hermann, R.F.W., Tanigaki, K., Kawaguchi, T. and Kuroshima, S., Zhou, O., Phys. Rev. B 13245, 60 (1999).Google Scholar
Anno, H., Hokazono, M., Kawamura, M., Nagao, J., and Matsubara, K., Proceedings of 21st International Conference on Thermoelectrics, LONG BEACH, CA, 25–29AUG 2002.Google Scholar
Jaussaud, N., Gravereau, P., Pechev, S., Chevalier, B., Menetrier, M., Dordor, P., Decourt, R., Goglio, G., Cros, C., and Pouchard, M., C. R. Chimie 39, 8 (2005).Google Scholar
Toberer, E.S., May, A.F., Snyder, G.J., Chem. Mater. 624, 22 (2010).Google Scholar
Deng, S.K., Tang, X.F., and Tang, R.S., Chin. Phys. B 3084, 18 (2009).Google Scholar
Cordier, G., and Woll, P., J. Less-Common Met. 169, 291 (1991).10.1016/0022-5088(91)90076-GCrossRefGoogle Scholar
Anno, H., Hokazono, M., Takakura, H., and Matsubara, K., Proceedings of 24st International Conference on Thermoelectrics, Clemson, SC, 19–23JUN 2005.Google Scholar
Anno, H., Hokazono, M., Kawamura, M., and Matsubara, K., Proceedings of 22nd International Conference on Thermoelectrics, La Grande Motte, FRANCE, 17–21AUG 2003.Google Scholar
Aydemir, U., Candolfi, C., Ormeci, A., Oztan, Y., Baitinger, M., Oeschler, N, Steglich, F., and Grin, Y., Phys. Rev. B 195137, 84 (2011).Google Scholar