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Synchrotron Small Angle X-ray Scattering Study of Melt Crystallized Polymers

Published online by Cambridge University Press:  10 February 2011

Georgi Georgiev ,
Patrick Shuanghua Dai ,
Elizabeth Oyebode ,
Peggy Cebe  and
Malcolm Capel
Georgi Georgiev
Affiliation:
Dept. of Physics and Astronomy, Tufts University, Science and Technology Center, Medford, MA 02155
Patrick Shuanghua Dai
Affiliation:
Dept. of Physics and Astronomy, Tufts University, Science and Technology Center, Medford, MA 02155
Elizabeth Oyebode
Affiliation:
Dept. of Physics and Astronomy, Tufts University, Science and Technology Center, Medford, MA 02155
Peggy Cebe*
Affiliation:
Dept. of Physics and Astronomy, Tufts University, Science and Technology Center, Medford, MA 02155
Malcolm Capel
Affiliation:
Biology Dept., Brookhaven National Laboratory, Upton, NY 11973
*
* To whom correspondence should be addressed
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Abstract

In this paper we report a synchrotron small angle x-ray scattering (SAXS) study of development of structure in semicrystalline Poly(Ether Ether Ketone), (PEEK) and an 80/20 blend with amorphous Poly(Ether Imide) (PEEK/PEI). Samples were treated to dual stage melt crystallization scheme involving initial isothermal crystallization at T1 followed by a second isothermal period at T2 (T1 < T2). Intensity of small angle scattering was measured in real-time. Structural parameters characterizing the lamellar thickness, 1c, long period, L, and SAXS invariant were deduced from the one-dimensional electron density correlation function assuming an ideal, two-phase structural model.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 137
Copyright
Copyright © Materials Research Society 2000

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References

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