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Synchrotron Microtomography of Composites

Published online by Cambridge University Press:  21 February 2011

S. R. Stock
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
J. H. Kinney
Affiliation:
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
T. M. Breunig
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
U. Bonse
Affiliation:
Department of Physics, Dortmund University, FRG
S. D. Antolovich
Affiliation:
Mechanical Properties Research Laboratory and School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA
Q. C. Johnson
Affiliation:
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
M. C. Nichols
Affiliation:
Exploratory Chemistry Division, Sandia National Laboratory, Livermore, CA, USA
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Abstract

X-ray computed tomography (CT) uses absorption profiles from many different viewing directions to reconstruct the two-dimensional distribution of x-ray absorptivity within a slice of the sample. The tunability, high brightness and parallelism of synchrotron radiation are critical to high resolution (0.001mm), high contrast (1%) CT or microtomography. In situ study of samples multiple times during the course of an experiment is exciting to consider.

Continuous fiber SiC/Al composites were deformed under three-point bending, and the resulting damage and fiber arrangement were revealed with synchrotron microtomography. Several hundred slices of 0.012 mm thickness were recorded simultaneously using 25 key radiation and a phosphor screen/charge coupled device (CCD) detector. Reconstruction was with the filtered back projection method. Low density regions were observed in the matrix in regions of highest stress where cracking is expected.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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