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Surface Characterization by Reflection Electron Microscopy (REM)

Published online by Cambridge University Press:  25 February 2011

Tung Hsu  and
J. M. Cowley
Tung Hsu
Affiliation:
Dept. of Physics, Arizona State University, Tempe, AZ 85287
J. M. Cowley
Affiliation:
Dept. of Physics, Arizona State University, Tempe, AZ 85287
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Abstract

Reflection electron microscopy (REM) utilizes the Bragg reflected high energy electrons to form the image of a crystal surface. Images of dislocations, atomic steps, reconstructions of surface layers of atoms and adatoms, stacking faults and twinning, superlattices, etc., have been successfully observed on a wide variety of specimens. Contrast is mainly due to diffraction and phase, which distiguished REM as a unique method for high spacial resolution and high sensitivity imaging of the surfaces of bulk specimens. REM can be effectively performed under UHV as well as under the moderate vacuum of an ordinary commercial electron microscope.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 121
Copyright
Copyright © Materials Research Society 1985

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