Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-28T07:40:07.656Z Has data issue: false hasContentIssue false

Study of The Electronic Transport of Pentacene Films by Photoconductivity and Photothermal Deflection Spectroscopy

Published online by Cambridge University Press:  01 February 2011

D. Knipp
Affiliation:
Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304
R. Carius
Affiliation:
Research Center Jülich, Institute of Photovoltaics, Jülich, Germany
J. Klomfass
Affiliation:
Research Center Jülich, Institute of Photovoltaics, Jülich, Germany
R.A. Street
Affiliation:
Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304
Get access

Abstract

The performance of thermally evaporated pentacene TFTs is strongly affected by defects. The influence of the preparation conditions on the level of defects were studied by Photoconductivity (CPM) and Photothermal Deflection Spectroscopy (PDS). CPM and PDS are powerful tools to provide insights in the band structure, the sub band gap absorption, distribution of defects and the ordering of the material. The influence of the preparation conditions on the morphology and the structural properties will be discussed and correlated with experimental data of CPM and PDS. In particularly, the influence of the deposition temperature on the absorption spectra of the polycrystalline films will be addressed. Furthermore, the material analyse will be correlated with the device performance of pentacene TFTs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Schön, J.H., Berg, S. Kloc, Ch., Batlogg, B. Science 287, 1022–123 (2000).Google Scholar
2. Schön, J. H., Batlogg, B. J. Appl. Phys, 89 (1), 336 (2001).Google Scholar
3. Street, R. A. Knipp, D. and Völkel, A. R., Appl. Phys. Lett. 80, 1658 (2002).Google Scholar
4. Knipp, D. Street, R.A. Krusor, B. Apte, R.B. Ho, J. SPIE Proc. 3366 820 (2001).Google Scholar
5. Jackson, W.B. Amer, N.M. Boccara, A.C. Fournier, D. Appl. Optics 20 1333 (1981).Google Scholar
6. Vaněček, M., Koěka, J., Třiska, A., Solid State. Comm. 390 (1981).Google Scholar
7. Silinish, E.A. Capek, V. Organic Molecular Crystals: Interaction, Localization, and Transport Phenomena, Spinger-Verlag (2000).Google Scholar
8. Jentsch, T. Juepner, H. J. Brzezinka, K.W. Lau, A. Thin Solid Films 315 273280 (1998).Google Scholar
9. Klauk, H. Gundlach, D. J. Nichols, J. A. Sheraw, C. D. Bonse, M. and Jackson, T. N., Solid State Technology 43 (3), 6377 (2000).Google Scholar
10. Völkel, A., Street, R.A. Knipp, D. this conferenceGoogle Scholar