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Structures of Silver/Cobalt Metallic Superlattice and Changes Due to Annealing

Published online by Cambridge University Press:  21 February 2011

T. Kingetsu ,
K. Sakai ,
T. Kaneko ,
A. Yamaguchi  and
R. Yamamoto
T. Kingetsu
Affiliation:
Nisshin Steel Company Ltd., New Materials Research Laboratories, 7-1 Koya-Shinmachi, Ichikawa, Chiba 272, Japan
K. Sakai
Affiliation:
Nisshin Steel Company Ltd., New Materials Research Laboratories, 7-1 Koya-Shinmachi, Ichikawa, Chiba 272, Japan
T. Kaneko
Affiliation:
University of Tokyo, Research Center for Advanced Science and Technology, 4-6-1 Komaba, Meguro, Tokyo 153, Japan
A. Yamaguchi
Affiliation:
University of Tokyo, Research Center for Advanced Science and Technology, 4-6-1 Komaba, Meguro, Tokyo 153, Japan
R. Yamamoto
Affiliation:
University of Tokyo, Research Center for Advanced Science and Technology, 4-6-1 Komaba, Meguro, Tokyo 153, Japan
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Abstract

Ag/Co metallic superlattices were grown onto Ag buffer layers pre-deposited on sapphire or MgO substrates by ultrahigh vacuum alternate deposition technique. In-situ RHEED observations during superlattice growth and ex-situ XRD measurements revealed that structures of the superlattices were strongly affected by the condition of Ag buffer layer preparation. In case where the Ag buffer layers were single crystals with smooth (111) surfaces, Co layers were epitaxially grown on the buffer layers even in the presence of large lattice mismatch, and whole the superlattices were grown with an epitaxial relation. Interface smoothness was strongly related to the growth temperature. Spotty RHEED patterns of Co layers for a low growth temperature indicated that the Co layers had an FCC structure. Post-annealing of the samples, in some cases, destroyed a superlattice structure completely. From relations between magnetic anisotropy and Co-layer thickness obtained with VSM measurements, it was found that Ag/Co superlattice exhibited in-plane magnetic anisotropy down to a Co thickness of 4A and that the anisotropy was correlated with roughness of the interfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 309
Copyright
Copyright © Materials Research Society 1990

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