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Structure of Oxides Grown on Zr-20Nb Alloy

Published online by Cambridge University Press:  15 February 2011

O.T. Woo ,
D.J. Lockwood ,
Y.P. Lin  and
V.F. Urbanic
O.T. Woo
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario K0J 1J0, CANADA
D.J. Lockwood
Affiliation:
National Research Council of Canada, Institute for Microstructural Sciences, Montreal Road, Ottawa, Ontario K1A 0R6, CANADA
Y.P. Lin
Affiliation:
Ontario Hydro Technologies, 800 Kipling Avenue, Toronto, Ontario M8Z 5S4, CANADA
V.F. Urbanic
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario K0J 1J0, CANADA
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Abstract

Oxides grown on Zr-20Nb were characterized by Raman Spectroscopy (RS), X-Ray Diffraction (XRD) and Transmission Electron Microscopy (TEM). These oxides were steamformed at 400°C, water-formed at 360 °C and at 300 °C, and air-grown at 400°C. For the oxides grown after relatively short exposures at 360°C and at 400°C, Raman spectra revealed broad peaks at 260 and 660 cm− indicating a crystal structure with high symmetry. Comparison with reference Raman spectra of cubic (c), tetragonal (t), and monoclinic (m) ZrO2 suggested that the oxide was predominantly nearly-cubic (tetragonal with c/a ratio ≈ 1), with minor amounts of moxide. The tetragonality is found to be consistent with TEM analyses and XRD results which showed the presence of a doublet near 2θ ° 74°. The crystal structure in the short-term exposed oxides is interpreted in terms of a tetragonal distortion arising from the displacement of oxygen atoms within the cubic ZrO2 crystal structure. For oxides grown after longer periods of exposure at 300°C and at 400°C, RS and XRD indicate increased amounts of m-oxide.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 357: Symposium C – Structure and Properties of Interfaces in Ceramics , 1994 , 219
Copyright
Copyright © Materials Research Society 1995

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References

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