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Structure of Molecularly -Thin Perfluoropolyether Films on Amorphous Carbon Surfaces

Published online by Cambridge University Press:  10 February 2011

G.W. Tyndall  and
R.J. Waltman
G.W. Tyndall
Affiliation:
IBM, Almaden Research Center, 650 Harry Road, San Jose, CA 95120
R.J. Waltman
Affiliation:
IBM, Storage Systems Division, 5600 Cottle Road, San Jose, CA 95193
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Abstract

Surface energies of molecularly-thin, perfluoropolyether (PFPE)-lubricated, amorphous carbon surfaces are presented as a function of the applied PFPE structure and thickness. A framework is developed to aid in the interpretation of the surface energy data. Information regarding the structure of these PFPE films adsorbed on CHx at the monolayer thickness levels is elucidated. Evidence for ordering in these polymer films is presented and interpreted to result from a combination of both, lateral cohesive interactions within the plane of the monolayer, and adhesive interactions between the PFPE monolayer and the underlying substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 517: Symposium F – Wide Bandgap Semiconductors for High Power, High Frequency , January 1998 , 403
Copyright
Copyright © Materials Research Society 1998

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References

1. Waltman, R.J., and Tyndall, G.W., J. P/n's. Chein., submitted (1998).Google Scholar
2. Waltman, R.J., and Tyndall, G.W., Ph/,s. Chiem., submitted (1998).Google Scholar
3. Tyndall, G.W., Waltman, R.J., and Pocker, D., Langmuir, submitted (1998).Google Scholar
4. Adamson, A.W., Physical Chemistry of Surfaces, 5th ed., John Wiley and Sons, NY, (1990).Google Scholar
5. Good, R.J., Chaudhury, M.K., and van Oss, C.J., Fundamentals of Adhesion, ed. Lee, L.-H, Plenum Press, New York (1991) pg. 153.Google Scholar
6. Waltman, R.J., Pocker, D.J., and Tyndall, G.W., Trib. Lett., accepted (1998).Google Scholar
7. Kasai, P. H.,. Appl. Polyin. Sci., 57, 797 (1995).Google Scholar
8. Doan, V., Koppc, R., and Kasai, P. H., J. Am. Chemn. Soc., 119, 9810 (1997).Google Scholar
9. Kato, T., Kameyama, M., Ehara, M., and limura, K., Langmuir, 14, 1786 (1998).Google Scholar
10. Ruhe, J., Blackman, G., Novotny, V.J., Clarke, T., Street, G.B., and Kuan, S., I Appl. Polym. Sci., 53, 825 (1994).Google Scholar
11. Wang, R.-H., White, R.L., Meeks, S.W., Min, B.G., Kellock, A., Homola, A., and Yoon, D., IEEE Trans. Magn., 32, 3777 (1996).10.1109/20.538833Google Scholar