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Structural Characterization of a Functionalized Organic Semiconductor

Published online by Cambridge University Press:  01 February 2011

Melissa Stickle
Affiliation:
Biomedical Engineering, Rutgers University, Piscataway, NJ 08823U.S.A.
Refik Kortan
Affiliation:
Biomedical Engineering, Rutgers University, Piscataway, NJ 08823U.S.A.
Sandrine Rivillon
Affiliation:
Chemistry and Chemical Biology, Rutgers University, Piscataway, NJ 08823U.S.A.
Zhenan Bao
Affiliation:
Chemical Engineering, Stanford University, Stanford, CA 94305U.S.A.
Howard Katz
Affiliation:
Materials Science and Engineering, Johns Hopkins University, Baltimore, MD 21218U.S.A.
Yves Chabal
Affiliation:
Biomedical Engineering, Rutgers University, Piscataway, NJ 08823U.S.A. Chemistry and Chemical Biology, Rutgers University, Piscataway, NJ 08823U.S.A.
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Abstract

We report the structure of 5,5′-bis(4-hydroxyhexylphenyl)-2,2′-bithiophene (HO6PTTP60H) powder and sublimated films studied by X-ray diffraction (XRD) and Infrared absorption spectroscopy (IRAS). From XRD, herringbone packing is observed for the HO6PTTP60H powder. Different layer spacing is found for the powder (33.1Å) and the sublimated film (26.5Å). This slight difference indicates that the HO6PTTP60H molecule is tilted in the film. IRAS results confirm the presence of the HO6PTTP6OH molecule on the surface and its good stability over a few days.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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