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Structural Characterisation of Fe-Cu Multilayers of Differing Fe Thicknesses Using Transmission Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

S. J. Lloyd ,
R. E. Somekh  and
W. M. Stobbs
S. J. Lloyd
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
R. E. Somekh
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
W. M. Stobbs
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
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Abstract

In-plane and out-of-plane lattice parameters were measured in a series of coherent Fe-Cu multilayers using non-axial high resolution electron microscopy (HREM). The results indicate that the multilayers are tetragonally distorted with the magnitude of the distortion varying with the thickness of the Fe component. These distortions preclude an understanding of the multilayer structure in terms of conventional elasticity theory. The breakdown of epitaxy for thicker Fe layers was also investigated and it was found that the b.c.c. Fe grew with [110] parallel to [001] of the coherent f.c.c. multilayer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 382: Symposium G – Structure and Properties of Multilayered Thin Films , 1995 , 155
Copyright
Copyright © Materials Research Society 1995

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References

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