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Structural and Morphological Characterization of Nanostructured Cobalt Ferrite Thin Films by Pulsed Laser Deposition

Published online by Cambridge University Press:  01 February 2011

K. Mohan Kant  and
M.S. Ramachandra Rao
K. Mohan Kant
Affiliation:
[email protected], Indian Institute of Technology Madras (IITM), Physics, Department of Physics and Materials Science Research Centre,, Chennai, Tamil Nadu, 600 036, India
M.S. Ramachandra Rao
Affiliation:
[email protected], Indian Institute of Technology Madras, Department of Physics, Chennai, 600036, India
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Abstract

Cobalt ferrite (CoFe2O4) thin films were deposited on quartz and single crystalline MgO(001) substrates using pulsed laser deposition (PLD) technique. The orientation of the as-deposited films were investigated as a function of substrate temperature (TS) in the range 200°C – 750°C. Films grown on MgO at higher substrate temperature were found to be (001) oriented while the films grown at lower substrate temperature were polycrystalline in nature. Magnetic measurements reveal that films deposited at lower substrate temperature had lower magnetic moment compared to that of films grown with higher substrate temperature, indicating the correlation between magnetic order and crystallinity. This is attributed to the presence of ordered magnetic domains in the oriented films even though the microstructure remains the same.

Keywords

thin filmmagnetic propertiesstructural
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 962: Symposium P – Nanoscale Magnets – Synthesis, Self-Assembly, Properties and Applications , 2006 , 0962-P09-08
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Shenker, H., Phys. Rev. 107 (5) (1957) 1246.Google Scholar
2. Grigorova, M., Blythe, H.J., Blaskov, V., Rusanov, V., Petkov, V., Masheva, V., Nihtianova, D., Martinez, L.M., Muñoz, J.S, Mikhov, M., J. Magn. Magn. Mater.183(1998) 163.Google Scholar
3. Margulies, D.T., Parker, F.T., Rudee, M.L., Spada, F.E., Chapman, J.N., Aitchson, P.R., Berkowitz, A.E., Phys. Rev. Lett. 79 (1997) 5162.Google Scholar
4. Hu, G., Choi, J.H., Eom, C.B., Harris, V.G., Suzuki, Y., Phys. Rev. B 62 (2000) R779.Google Scholar
5. Williams, C. M., Chrisey, D. B., Lubitz, P., Grabowski, K. S., and Cotell, C. M., J. Appl. Phys. 75, 1676 (1994)Google Scholar
6. Matsushita, N., Nakagawa, S., and Naoe, M., IEEE Trans. Magn. MAG-28, 3108 (1992).Google Scholar
7. Okuno, S. N., Hashimoto, S., and Inomata, K., J. Appl. Phys. 71, 5926 (1992)Google Scholar
8. Abe, M. and Gomi, M., J. Appl. Phys. 53, 8172 (1982)Google Scholar
9. Martens, J. W. D., J. Appl. Phys. 59, 3820 (1986)Google Scholar
10. Peeters, W. L. and Martens, J. W. D., J. Appl. Phys. 53, 8178 (1982).Google Scholar
11. Miller, R. and Schiippel, W., J. Magn. Magn.Mater., 155, 1996, 110.Google Scholar