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Stress-strain behavior of individual electrospun polymer fibers using combination AFM and SEM

Published online by Cambridge University Press:  31 January 2011

Fei Hang ,
Dun Lu ,
Shuang Wu Li  and
Asa H Barber
Fei Hang
Affiliation:
[email protected], Queen Mary University of London, Centre for Materials Research & School of Engineering and Materials Science, London, United Kingdom
Dun Lu
Affiliation:
[email protected], Queen Mary University of London, Centre for Materials Research & School of Engineering and Materials Science, London, United States
Shuang Wu Li
Affiliation:
[email protected], Queen Mary University of London, Centre for Materials Research & School of Engineering and Materials Science, London, United Kingdom
Asa H Barber
Affiliation:
[email protected], Queen Mary University of London, Centre for Materials Research & School of Engineering and Materials Science, London, United Kingdom
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Abstract

Tensile deformation of individual electrospun polyvinyl alcohol (PVA) nanofibres was performed using a novel combination atomic force microscope (AFM)- scanning electron microscope (SEM) technique. The AFM was used to provide manipulation and mechanical testing of individual PVA nanofibers while the SEM was used to observe the deformation process. Resultant stress-strain curves show how the elastic modulus shows comparable, or even slightly increased, values to isotropic films. In addition, the electrospun fibers were tested to failure to measure their tensile strength.

Keywords

stress/strain relationshipfibernanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1185: Symposium II – Probing Mechanics at Nanoscale Dimensions , 2009 , 1185-II07-10
Copyright
Copyright © Materials Research Society 2009

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