Hostname: page-component-745bb68f8f-kw2vx Total loading time: 0 Render date: 2025-02-04T17:59:02.842Z Has data issue: false hasContentIssue false
  • English
  • Français

Strain and Interdiffusion Profiles in Epitaxied AU/NI (100) Multilayers Deduced From X-Ray Diffraction Experiments

Published online by Cambridge University Press:  21 February 2011

B. Gilles  and
A. Marty
B. Gilles
Affiliation:
LTPCM, ENSEEG, BP 75, 38402, Grenoble, France
A. Marty
Affiliation:
DRFMC/SP2M, 38054 Grenoble, Cedex 9, France
Get access

Abstract

Au(100)/Ni(100) periodic superlattices have been grown by the MBE technique specially for X-ray diffraction experiments. The nominal number of Ni planes deposited were 1.5, 2, 4 and 5 ML and the thickness of the gold layers was always 1.5 nm. The X-ray profiles have been simulated using a kinematical structure refinement program. The obtained strain profiles are in very good agreement with earlier HREM results. It is shown that a strong interdiffusion occurs during the growth.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 356: Symposium B2 – Thin Films: Stresses and Mechanical Properties V , 1994 , 379
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Gilles, B., Marty, A., Patrat, G., Vassent, J.L., Joud, J.C. and Chamberod, A. in Mechanisms of Thin Film Evolution. Mater Res. Soc. Proc, Fall Meeting Boston 1993 Google Scholar
[2] Bruinsma, R. and Zangwill, A., J. Physique 47 1051 (1985)Google Scholar
[3] Bayle, P., Deutsch, T., Gilles, B., Lançon, F., Marty, A. and Thibault, J., to appear in UltamicroscopyGoogle Scholar
[4] Cahn, J.W. and Larché, F., Acta Metall. 32, 1915 (1984)Google Scholar
[5] Fullerton, E.E., Schuller, I.K., Vanderstraeten, H. and Bruynseraede, Y., Phys. Rev. B 45 (16) 9292 (1992)Google Scholar