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SPM-based Electrical Characterization of Aged Waspaloy Microstructures

Published online by Cambridge University Press:  01 February 2011

Siva Kumar V. Kelekanjeri G.  and
Rosario A Gerhardt
Siva Kumar V. Kelekanjeri G.
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, 2025 Peachtree Rd.,, Apt#649,, Atlanta, GA, 30309, United States, 4046431431, 4048949140
Rosario A Gerhardt
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, 771 Ferst Drive,, Room 288, Love Bldg.,, Atlanta, GA, 30332-0245, United States
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Abstract

The results of SPM-based localized electrical examination of precipitation hardened Waspaloy microstructures using Electrostatic Force Microscopy (EFM) and Current-Atomic Force Microscopy (I-AFM) are reported herein. The measurements were conducted on two differently etched specimens with the same initial microstructure. Selective etching by preferentially removing the γ′ or the γ phase resulted in a non-uniform surface topography leaving the less reactive phase standing in relief relative to the depressed phase. The presence of a non-uniform surface topography affected the measured EFM response by causing an inhomogeneous surface voltage distribution. A non-linear tip-surface interaction could have further complicated the measured EFM response by making it non-localized. The EFM phase obeyed a supplementary behavior upon reversing the polarity of the DC bias. Using I-AFM, the tip current was found to be the highest at γ-γ′ interphase boundaries, which was attributed to the relaxation of the lattice atoms in the relief zone formed upon etching.

Keywords

scanning probe microscopy (SPM)electrical propertiesmicrostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1025: Symposium B – Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy , 2007 , 1025-B13-10
Copyright
Copyright © Materials Research Society 2008

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