No CrossRef data available.
Article contents
Spectroscopic Ellipsometry Studies of Tb-doped SiO2 Thin Films
Published online by Cambridge University Press: 01 February 2011
Abstract
The optical properties of Tb-doped SiO2 films have been studied from multi-wavelength spectroscopic ellipsometry (SE) measurements performed over the 250–1100 nm wavelength range. The SE modeling carried out with care to adhere as much to the ellipsometric fitting qualities. The refractive index dispersions, the layer thickness, and the lateral thickness variation of the films are given and discussed regarding the optical constitution of these films and the ellipsometric validity of these parameters
Keywords
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2007