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Solute Partitioning and Interfacial Segregation in TiAl-Based Alloys

Published online by Cambridge University Press:  10 February 2011

D. J. Larson  and
M. K. Miller
D. J. Larson
Affiliation:
Microscopy and Microanalysis Group, Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783 1-6376, larsondj @ornl.gov
M. K. Miller
Affiliation:
Microscopy and Microanalysis Group, Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 3783 1-6376, larsondj @ornl.gov
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Abstract

Atom probe microscopy has been used to investigate elemental partitioning and segregation behavior in a TiAl-based alloy with a variety of alloying additions including Cr, Nb, W and B. These results indicate that in a stress-relieved state (2 h at 900°C) and a reheated state (2 h at 900°C, 2184 h at 800°C and 2 h at 1210°C) chromium, and to a lesser extent tungsten, is partitioned to the α2 phase. However, in an annealed state (2 h at 900°C and 720 h at 800°C), these elements are partitioned to the, γ phase. Segregation of chromium and tungsten to lamellar interfaces is observed in the stress-relieved material, but significant segregation was not observed in material subjected to the other heat treatments. A W- and B-enriched precipitate was observed in the reheated material and provides a possible explanation for the low tungsten concentrations measured in the matrix phases.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 552: Symposium KK – High-Temperature Ordered Intermetallic Alloys VIII , 1998 , KK2.9.1
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Huang, S. C., Structural Intermetallics, eds. Darolia, R., Lewandowski, J., Liu, C. T., Martin, P., Miracle, D. and Nathal, M., TMS, Warrendale, PA, 1993, p. 299.Google Scholar
2. Kim, Y.-K., Gamma Titanium Aluminides, eds. Kim, Y-K., Wagner, R. and Yamaguchi, M., TMS, Warrendale, PA, 1995, p. 637.Google Scholar
3. Liu, C. T., Schneibel, J. H., Maziasz, P. J., Wright, J. L. and Easton, D. S., Intermetallics 4 (1996) 429.CrossRefGoogle Scholar
4. Miller, M. K., Cerezo, A., Hetherington, M. G., and Smith, G. D. W., Atom Probe Field Ion Microscopy, Oxford University Press, Oxford, England, (1996).Google Scholar
5. Menand, A., Huget, S. and Nerac-Pertaix, A., Acta Mater. 44 (1996) 4729.CrossRefGoogle Scholar
6. Larson, D. J., Liu, C. T., and Miller, M. K., Mat. Sci. Eng. A 239–240 (1997) 220.CrossRefGoogle Scholar
7. Larson, D. J. and Miller, M. K., Mat. Sci. Eng. A 250 (1998) 65.Google Scholar
8. Larson, D. J. and Miller, M. K., Mat. Char. (1999) in press.Google Scholar
9. Miller, M. K. and Smith, G. D. W., Appt. Surf. Sci. 87/88 (1995) 243.CrossRefGoogle Scholar
10. Ramanujan, R. V., Maziasz, P. J., and Liu, C. T., Acta Mater. 44 (1996) 2611.CrossRefGoogle Scholar