Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-28T14:01:02.503Z Has data issue: false hasContentIssue false

Size Effects Determined from Tensile Tests of Perforated MEMS Scale Specimens

Published online by Cambridge University Press:  15 March 2011

Ioannis Chasiotis
Affiliation:
Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA 22904, U.S.A.
Wolfgang G. Knauss
Affiliation:
Graduate Aeronautical Laboratories, California Institute of Technology, Pasadena, CA 91125, U.S.A.
Get access

Abstract

A systematic study of small-scale size effects has been conducted on elliptically perforated specimens with minimum radius of curvature of 1 micron. This study aimed at assessing the dependence of failure stress at the tip of a notch on varying: (a) stress concentration for constant radius of curvature, (b) radius of curvature of micro-notches relative to the material grain size and constant stress concentration. The experiments demonstrate a strong influence of notch radius on the failure strength of MEMS scale specimens, while the effect of the stress concentration factor is of rather secondary importance. The local failure strength at the tip of a notch increases when the radius of curvature becomes smaller, which is in accordance with the probabilistic nature of failure. When the notch radius becomes as small as 1 micron (only three times larger than the grain size) then a strong size effect is observed. This effect becomes moderate for larger radii of curvature, up to 8 microns (25 times the grain size), when the failure stress at the notch tip almost reaches the tensile strength recorded for 50 micron wide samples.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Ding, J.N., Meng, Y.G., and Wen, S.Z., Mat.Science and Engineering B83, 4247, (2001).Google Scholar
2. Namazu, T., Isono, Y. and Tanaka, T., Proc. IEEE 13th Int. Conf. MEMS, 2000, pp. 205210.Google Scholar
3. Sharpe, W.N, Jackson, K.M., Hemker, K.J. and Xie, Z., JMEMS 10 (3), 317326, (2001).Google Scholar
4. Sharpe, W. N. Jr., Brown, S., Johnson, G. C., and Knauss, W. G., Mater. Res. Soc. Proc. 518, San Francisco, CA, 1998, pp. 5765.Google Scholar
5. Chasiotis, I. and Knauss, W.G., Proc. of the SPIE 4175, Santa Clara, CA, 2000, pp. 96103.Google Scholar
6. Chasiotis, I. and Knauss, W.G., Mater. Res. Soc. Proc. 657, Boston, MA, 2000.Google Scholar
7. Neuber, H., Theory of Notch Stresses. Edwards Bros Inc., Ann Arbor, Michigan, (1946).Google Scholar
8. Isida, M. and Nakagawa, K., Proc. of 3rd Japan Nat. Congress for Appl. Mech., 1954, pp. 14.Google Scholar
9. Isida, M., Trans. of the Japan Soc. of Mech. Eng. 21, 514, (1955).Google Scholar
10. Tan, S.C., J. Comp. Mater. 22, 10801097, (1988).Google Scholar