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Site Selective Magneto-Optical Studies of Eu ions in Gallium Nitride

Published online by Cambridge University Press:  19 July 2011

Nathaniel Woodward ,
Atsushi Nishikawa ,
Yasufumi Fujiwara  and
Volkmar Dierolf
Nathaniel Woodward
Affiliation:
Physics, Lehigh University, Bethlehem, Pennsylvania, U.S.A.
Atsushi Nishikawa
Affiliation:
Division of Materials and Manufacturing Science, Osaka University, Osaka, Japan.
Yasufumi Fujiwara
Affiliation:
Division of Materials and Manufacturing Science, Osaka University, Osaka, Japan.
Volkmar Dierolf
Affiliation:
Physics, Lehigh University, Bethlehem, Pennsylvania, U.S.A.
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Abstract

We report site-selective studies of the Zeeman splittings that are observed for magnetic fields up to 6.6T for different Eu incorporation sites in GaN. Utilizing resonant excitation with visible light, we are able to distinguish the site and find for one center (Eu1) a splitting into five components as expected for C3v symmetry. The corresponding g-values are 1.66 and 1.90. The two lines of another center Eu2 each split into two levels corresponding to g-values of 1.9 and 2.84. Most surprisingly a third center, for which only one line is clearly identified, a g-value of 6.16 is found which is larger than can be explained for a 7F2 purely ionic Eu state.

Keywords

magnetoopticnitrideEu
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1342: Symposium V – Rare-Earth Doping of Advanced Materials for Photonic Applications , 2011 , mrss11-1342-v05-06
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES:

1. Woodward, N., Poplawsky, J., Mitchell, B., Nishikawa, A., Fujiwara, Y., and Dierolf, V., Appl. Phys. Lett. 98, 011102 (2011).Google Scholar
2. Woodward, N., Nishikawa, A., Fujiwara, Y., and Dierolf, V., Opt. Mater. 33, 7 (2010).Google Scholar
3. Fleischman, Z., Munasinghe, C., Steckl, A. J., Wakahara, A., Zavada, J., and Dierolf, V., Appl. Phys. B: Lasers Opt. 97, 607 (2009).Google Scholar
4. Roqan, I. S., O‟Donnell, K. P., Martin, R. W., Edwards, P. R., Song, S. F., Vantomme, A., Lorenz, K., Alves, E., and Bockowski, M., Phys. Rev. B 81, 085209 (2010).Google Scholar
5. Kachkanov, V., O‟Donnell, K.P., Rice, C., Wolverson, D., Martin, R.W., Lorenz, K., Alves, E. and Bockowski, M., MRS Online Proceedings Library / Volume 1290 / mrsf10-1290-i03-06 (Proceedings MRS Fall Meeting 2010). Google Scholar
6. Nishikawa, A., Kawasaki, T., Furukawa, N., Terai, Y., and Fujiwara, Y., Appl. Phys. Express 2, 071004 (2009).Google Scholar