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Semiempirical Correlation between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents

Published online by Cambridge University Press:  21 March 2011

Francesco Di Quarto
Affiliation:
Dipartimento di Ingegneria Chimica dei Processi e dei Materiali, Università di Palermo, Viale delle Scienze, 90128 Palermo (Italy)
Monica Santamaria
Affiliation:
Dipartimento di Ingegneria Chimica dei Processi e dei Materiali, Università di Palermo, Viale delle Scienze, 90128 Palermo (Italy)
Salvatore Piazza
Affiliation:
Dipartimento di Ingegneria Chimica dei Processi e dei Materiali, Università di Palermo, Viale delle Scienze, 90128 Palermo (Italy)
Carmelo Sunseri
Affiliation:
Dipartimento di Ingegneria Chimica dei Processi e dei Materiali, Università di Palermo, Viale delle Scienze, 90128 Palermo (Italy)
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Abstract

On the basis of new experimental results a previous proposed correlation between the optical band gap of oxides and the difference of electronegativity of their constituents is extended to mixed crystalline and amorphous TiO2-Fe2O3 (d,d-metal oxides) as well as to amorphous passive films grown on Al-Ta, Al-Ti, Al-Nb and Al-W alloys (sp,d-metal oxides). Moreover in analogy with previous results on anhydrous oxides, a correlation is proposed between the optical band gap of hydroxides and the electronegativities of their constituents after substituting the electronegativity of hydroxilic group to that of the oxygen. Like in the case of anhydrous oxides, two different interpolation lines have been found for sp-metal and d-metal hydroxides, respectively.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

1. Santamaria, M., Huerta, D., Piazza, S., Sunseri, C. and Quarto, F. Di, J. Electrochem. Soc., 147, 1366 (2000)Google Scholar
2. Santamaria, M., Quarto, F. Di, Thompson, G.E. and Skeldon, P., Proceedings of the “2nd International Symposium on Al Surface Science and Technology (ASST2000)”, in press.Google Scholar
3. Quarto, F. Di, abs. no.1437, 196th Electrochemical Society Meeting, Honolulu (1999).Google Scholar
4. Quarto, F. Di, Sunseri, C., Piazza, S. and Romano, M.C., J. Phys. Chem. B, 101, 2519 (1997).Google Scholar
5. Gordy, W and Thomas, W.J.P., J. Phys. Chem., 24, 439 (1956).Google Scholar
6. Allred, A.L.J., Inorg. Nucl. Chem., 17, 215 (1961).Google Scholar
7. Kim, H., Hara, N. and Sugimoto, K., J. Electrochem. Soc., 146, 955 (1999).Google Scholar
8. Mott, N.F. and Davis, E.A., Electronic Processes in Non-crystalline Materials, 2nd Ed., Clarendon Press, Oxford (1979).Google Scholar
9. Habazaki, H., Shimizu, K., Skeldon, P., Thompson, G. E. and Wood, G.C., Thin Solid Films, 300, 131 (1997).Google Scholar
10. Quarto, F. Di, Piazza, S. and Sunseri, C., Current Topics in Electrochemistry, 3, ed. Alexander, J.C., 357, Research Trends, Trivandrum (1994).Google Scholar
11. Quarto, F. Di, Gentile, C., Piazza, S. and Sunseri, C., Corrosion Science, 35, 801 (1993).Google Scholar
12. Piazza, S., Calà, L., Sunseri, C. and Quarto, F. Di, Ber. Bunsenges. Phys. Chem., 101, 932 (1997).Google Scholar
13. Quarto, F. Di, Russo, G., Sunseri, C. and Paola, A. Di, J. Chem. Soc. Faraday Trans. 1, 78, 3433 (1982)Google Scholar
14. Smith, D.W., J. Chem. Edu., 67, 559 (1990).Google Scholar
15. Tuccio, G., Piazza, S., Sunseri, C. and Quarto, F. Di, J. Electrochem. Soc., 146, 493 (1999)Google Scholar
16. Quarto, F. Di, Gentile, C., Piazza, S. and Sunseri, C., J. Electrochem. Soc., 138, 1856 (1991).Google Scholar
17. Quarto, F. Di, Romano, M. C., Santamaria, M., Piazza, S. and Sunseri, C., Elektrokhimiya, 36, 1358 (2000).Google Scholar
18. Pourbaix, M., “Atlas of Electrochemical Equilibria”, Pergamon Press (1966).Google Scholar
19. Stimming, U., Electrochim. Acta, 31, 415 (1986).Google Scholar
20. Carpenter, M.K. and Corrigan, D.A., J. Electrochem. Soc., 136, 1022 (1989).Google Scholar
21. Quarto, F. Di, Piazza, S. and Sunseri, C., Corrosion Science,31, 721 (1990).Google Scholar
22. Quarto, F. Di, Piazza, S., Sunseri, C., Yang, M. and Cai, S. M., Electrochim. Acta, 41, 2511 (1996) and references therein.Google Scholar
23. Kurima, Y., Thompson, G.E., Shimizu, K. and Wood, G.C., Proceedings of 7th International Symposium on Oxide Films on Metals and Alloys, Hebert, K.R. and Thompson, G. E. Eds., Vol. 94–25, p. 256, The Electrochemical Society Inc., Pennington (1994).Google Scholar
24. Piazza, S., Caramia, S., Sunseri, C. and Quarto, F. Di, Proceedings of the Symposium on Passivity and Localized Corrosion, Seo, M. Ed., Vol. 99–27, p. 317, The Electrochemical Society Inc., Pennington (1999)Google Scholar
25. Kvit, A., Narayan, J., Sharma, A.K., Jin, C., Muth, J.F., Teng, C.W. and Holland, O.W., Proceedings of MRS 2000Fall Meeting, in press.Google Scholar