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Research Grade Instrumentation for Nanotechnology and MSE Education

Published online by Cambridge University Press:  31 January 2011

Christine Broadbridge
Affiliation:
[email protected]@gmail.com, Southern Connecticut State University, Department of Physics, New Haven, Connecticut, United States
Jacquelynn Garofano
Affiliation:
[email protected], Southern Connecticut State University, Department of Physics, New Haven, Connecticut, United States
Eric Altman
Affiliation:
[email protected], Yale University, Center for Research on Interface Structures and Phenomena, New Haven, Connecticut, United States
Yehia Khalil
Affiliation:
[email protected], Yale University, School of Engineering and Applied Science, New Haven, Connecticut, United States
Victor Henrich
Affiliation:
[email protected], Yale University, Center for Research on Interface Structures and Phenomena, New Haven, Connecticut, United States
Yaron Segal
Affiliation:
[email protected], Yale University, Center for Research on Interface Structures and Phenomena, New Haven, Connecticut, United States
Myrtle-Rose Padmore
Affiliation:
[email protected], Yale University, School of Engineering and Applied Science, New Haven, Connecticut, United States
Philip Michael
Affiliation:
[email protected], Yale University, School of Engineering and Applied Science, New Haven, Connecticut, United States
Fred Walker
Affiliation:
[email protected], Yale University, Center for Research on Interface Structures and Phenomena, New Haven, Connecticut, United States
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Abstract

The Center for Research on Interface Structures and Phenomena (CRISP) is a National Science Foundation (NSF) Materials Research Science and Engineering Center (MRSEC). CRISP is a partnership between Yale University, Southern Connecticut State University (SCSU) and Brookhaven National Laboratory. A main focus of CRISP research is complex oxide interfaces that are prepared using epitaxial techniques, including molecular beam epitaxy (MBE). Complex oxides exhibit a wealth of electronic, magnetic and chemical behaviors, and the surfaces and interfaces of complex oxides can have properties that differ substantially from those of the corresponding bulk materials. CRISP employs this research program in a concerted way to educate students at all levels. CRISP has constructed a robust MBE apparatus specifically designed for safe and productive use by undergraduates. Students can grow their own samples and then characterize them with facilities at both Yale and SCSU, providing a complete research and educational experience. This paper will focus on the implementation of the CRISP Teaching MBE facility and its use in the study of the synthesis and properties of the crystalline oxide-silicon interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1 Mckee, R. A., Walker, F. J., and Chisholm, M. F., Science, 293, 468 (2001).Google Scholar
2 Altman, E., From Surface to Interface: The Synthesis and Properties of a Crystalline Oxide-Silicon Interface, MBE module description.Google Scholar
3 Garrity, K., Padmore, M.-R., Segal, Y., Walker, F.J., Ahn, C.H., Ismail-Beigi, S., Phase Transition of Sr on Si (001): First-principles prediction and experiment; in preparation.Google Scholar