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Relaxation and Grain Growth Behavior of Nanocrystalline Iron

Published online by Cambridge University Press:  15 February 2011

J. C. Holzer
Affiliation:
California Institute of Technology, W.M. Keck Laboratory of Engineering Materials 138–78, Pasadena, CA 91125
R. Birringer
Affiliation:
Universität des Saarlandes, W-6600 SaarbrUcken, Germany
J. Eckert
Affiliation:
California Institute of Technology, W.M. Keck Laboratory of Engineering Materials 138–78, Pasadena, CA 91125
C.E. Krill III
Affiliation:
California Institute of Technology, W.M. Keck Laboratory of Engineering Materials 138–78, Pasadena, CA 91125
W.L. Johnson
Affiliation:
California Institute of Technology, W.M. Keck Laboratory of Engineering Materials 138–78, Pasadena, CA 91125
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Abstract

Nanocrystalline Fe has been prepared by inert gas condensation and ball milling. The kinetics of relaxation and grain growth are investigated by differential scanning calorimetry. The development of the microstructure is monitored by x-ray powder diffraction and transmission electron microscopy. Emphasis is placed on the differences observed for samples prepared by the two different techniques. We find that the kinetics of relaxation and grain growth are very sensitive to the sample preparation method. Samples with the same initial average grain size, as determined by the peak broadening in x-ray diffraction, show very different recovery behavior. The differences are discussed in terms of the estimated grain boundary energies and the initial grain size distribution obtained by the two preparation techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Gleiter, H., Prog. Mater. Sci. 33, 223 (1989).Google Scholar
2. Siegel, R. W., Annu. Rev. Mater. Sci. 21, 559(1991).Google Scholar
3. Birringer, R., Gleiter, H., and Klein, H.P., Marquardt, P., Phys. Lett. A 102, 356(1984).Google Scholar
4. Hellstern, E., Fecht, H.J., Fu, Z., and Johnson, W.L., J. Appl. Phys. 65 305 (1989).Google Scholar
5. Fecht, H.J.,Hellstern, E., Fu, Z., and Johnson, W.L., Met. Trans. A 21.2333 (1990).Google Scholar
6. Jang, J.S.C. and Koch, C.C., Scr. Metall. Mater. 24, 1599 (1990).Google Scholar
7. Eckert, J., Holzer, J.C., Krill, C.E. III, and Johnson, W.L., J. Mater. Res., in press.Google Scholar
8. Hellstern, E., Fecht, H. J., Garland, C., and Johnson, W. L., in Multicomponent Ultrafine Microstructures, edited by McCandlish, L. E., Polk, D. E., Siegel, R. W., and Kear, B. H. (Mater. Res. Soc. Symp. Proc. 132, Pittsburgh, PA, 1989), pp. 137142. Google Scholar
9. Eckert, J., Holzer, J.C., Krill, C.E. III, and Johnson, W.L., J. Appl. Phys., submitted.Google Scholar
10. Klug, H.P. and Alexander, L., X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (John Wiley and Sons, New York, 1974), p. 661.Google Scholar
11. Smithells, C.J., Smithells Metals Reference Book, 6th ed., edited by Brandes, E.A. (Butterworths, London, 1983), pp. 15–5.Google Scholar
12. Trudeau, M.L. and Schulz, R., Mater. Sci. Eng. A134, 1361 (1991).Google Scholar
13. Ouyang, H., Fultz, B., and Kuwano, H., preprint.Google Scholar
14. Atkinson, H. V., Acta Metall. 36, 469 (1988).Google Scholar