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The Pyrochlore-to-Perovskite Transformation in Solution-Derived Lead Zirconate Titanate Thin Films

Published online by Cambridge University Press:  15 February 2011

James A. Voigt ,
B.A. Tuttle ,
T.J. Headley  and
D.L. Lamppa
James A. Voigt
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185
B.A. Tuttle
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185
T.J. Headley
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185
D.L. Lamppa
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185
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Abstract

We have characterized the pyrochlore-to-perovskite crystallization process in solution-derived Pb(Zr0.20Ti0.80)O3 thin films on (100) MgO single crystal substrates. It has been determined that the perovskite phase nucleated preferentially at the film/MgO interface out of a nanocrystalline (≈100Å grains) pyrochlore matrix. During the early stages of the pyrochlore-to-perovskite conversion process, perovskite growth proceeded nearly isotropically from the substrate to form hemispherically shaped grains. Deviations from isotropie growth were shown to result from a growth dependence based on the crystallographic orientation of a growing perovskite grain relative to the orientations of pyrochlore grains being transformed. The volume change that occurs during the pyrochlore-to-pervoskite transformation along with two-dimensional grain growth has been used to develop a mechanism for formation of porosity that commonly is concentrated in grain boundary regions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 361: Symposium I2 – Ferroelectric Thin Films IV , 1994 , 395
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. (a) Ferroelectric Thin Films, edited by Myers, E.R. and Kingon, A.I. (Mater. Res. Soc. Proc. Pittsburgh, PA, 1990);Google Scholar
(b) Ferroelectric Thin Films II. edited by Kingon, A.I., Myers, E.R., and Tuttle, B.A. (see Ref. 1(a), 1992); andGoogle Scholar
(c) Ferroelectric Thin Films HI. edited by Myers, E.R., Tuttle, B.A., Desu, S.B., and Larsen, P.K. (see Ref. 1(a), 1993).Google Scholar
2. Tuttle, B.A., Voigt, J.A., Goodnow, D.C., Lamppa, D.L., Headley, T.J., Eatough, M.O., Zender, G., Nasby, R.D., and Rodgers, S.M., J. Amer. Ceram. Soc. 76 (6), 1573 (1993).Google Scholar
3. Kwok, C.K. and Desu, S.B., J. Mater. Res. 9, 1728 (1994)Google Scholar
4. Hsueh, C.C. and Mecartney, M.L., J. Mater. Res. 6, 2208 (1991).Google Scholar
5. Seifert, A., Lange, F.F., and Speck, J.S., J. Mater. Res. 10, March (1995).Google Scholar
6. Voigt, J.A., Tuttle, B.A., Headley, T.J., Eatough, M. O., Lamppa, D.L., and Goodnow, D., see Ref. 1c, pp. 15–22.Google Scholar
7. Schwartz, R.W., Bunker, B.C., Dimos, D., Assink, R.A., Tallant, D.R., Weinstock, I., and Haaland, D.M., Int. Ferroelectrics 2, 243 (1992).Google Scholar
8. Martin, F.W., Phys. Chem. Glasses 6, 143 (1965).Google Scholar
9. Shirane, G., Hoshino, S., and Suzuki, K., Phys. Rev. 80, 1105 (1950).Google Scholar
10. Morosin, B., Lawson, A.C., Kwei, G.H., Voigt, J.A., and Tuttle, B. A., in Neutron Scattering in Materials Science, edited by Neumann, D.A., Russell, T.P., and Wuensch, B.J. (Mater. Res. Soc. Proc. Pittsburgh, PA, 1995).Google Scholar