Hostname: page-component-745bb68f8f-b95js Total loading time: 0 Render date: 2025-01-27T15:50:22.676Z Has data issue: false hasContentIssue false
  • English
  • Français

Pulsed Laser Deposition and Characterization of Superconducting Ba1−xKxBiO3 Thin Films

Published online by Cambridge University Press:  26 February 2011

C. E. Platt ,
M. R. Teepe ,
C. Ciofl ,
H. Zhang ,
V. P. Dravid ,
R. A. Schweinfurth ,
D. J. Van Harlingen ,
J. A. Eades ,
C. H. Lin  and
D. Strother
...Show all authors
C. E. Platt
Affiliation:
Science and Technology Center for Superconductivity
M. R. Teepe
Affiliation:
Science and Technology Center for Superconductivity
C. Ciofl
Affiliation:
Science and Technology Center for Superconductivity
H. Zhang
Affiliation:
Science and Technology Center for Superconductivity
V. P. Dravid
Affiliation:
Science and Technology Center for Superconductivity
R. A. Schweinfurth
Affiliation:
Science and Technology Center for Superconductivity
D. J. Van Harlingen
Affiliation:
Science and Technology Center for Superconductivity
J. A. Eades
Affiliation:
Science and Technology Center for Superconductivity
C. H. Lin
Affiliation:
Science and Technology Center for Superconductivity
D. Strother
Affiliation:
Superconductor Technologies Inc., Santa Barbara, CA 93111
R. Hammond
Affiliation:
Superconductor Technologies Inc., Santa Barbara, CA 93111
Get access

Abstract

We report on high quality Ba1−xKxBiO3 (BKBO) thin films grown by pulsed laser deposition. The best films exhibit resistive and magnetic transition temperatures of 28 K, with a transition width of 0.4 K and critical current densities above 106 A/cm2 measured at 5 K. Surface impedance is measured to be 1 mΩ. Films are single phase and highly oriented in the (100) direction and electron diffraction shows no other phases. Analysis using Moire' fringes shows films to consist of 100 nm size dislocation-free regions which show a high degree of in-plane epitaxy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 807
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Pei, S., Jorgenson, J. D., Dabrowski, B., Hinks, D. G., Richards, D. R., Mitchell, A. W., Newsam, J. M., Sinha, S. K., Vaknin, D., and Jacobson, A. J., Phys. Rev. B41, 4126 (1990).Google Scholar
2. Huang, Q., Zasadzinski, J. F., Gray, K. E., Richards, D. R., and Hinks, D. G., Appl. Phys. Lett. 57, 2356 (1990).Google Scholar
3. Sato, H., Takagi, H., and Uchida, S., Physica C 169, 391 (1990).Google Scholar
4. Pargellis, A. N., Sharifi, F., Dynes, R. C., Miller, B., Hellman, E. S., Rosamilia, J. M., and Hartford, E. H., Appl. Phys. Lett. 58, 95 (1991).Google Scholar
5. Moon, B. M., Platt, C. E., Schweinfurth, R. A. and Van Harlingen, D. J., Appl. Phys. Lett. 59, 1905 (1991).Google Scholar
6. Cava, R. J., Batlogg, B., Krajewsli, J. J., Farrow, R. C., Rupp, L. W. Jr, White, A. E., Short, K. T., Pech, W. F. Jr, and Kometani, T. Y., Nature 332, 814 (1988).Google Scholar
7. Hinks, D., Dabrowski, B., Jorgenson, J. D., Mitchell, A. W., Richards, D. R., Pei, S., and Shi, D., Nature 333, 836 (1988).Google Scholar
8. Huang, Q., Zasadzinski, J. F., Tralshawala, N., Gray, K. E., Hinks, D. G., Peng, J. L., and Greene, R. L., Nature 347, 369 (1990).Google Scholar
9. Platt, C. E., Schweinfurth, R. A., Teepe, M. R. and Van Harlingen, D. J., to be published in the Proceedings of the Lattice Effects in High-TV- Superconductors Conference, edited by Bar-Yam, Yaneer, published by World Scientific Publishing Co. 1992.Google Scholar
10. Pei, S. Y., Jorgenson, J. D., Hinks, D. G., Zheng, Y., Richards, D. R., Dabrowski, B., and Mitchell, A. W., J. Solid State Chem. 95, 29–38 (1991).Google Scholar
11. Hinks, D. G., Mitchell, A. W., Zheng, Y., Richards, D. R., and Dabrowski, B., Appl. Phys. Lett. 54, 1585 (1989).Google Scholar
12. Verwerft, M., Van Teneloo, G., Hinks, D. G., Dabrowski, B., Richards, D. R., Mitchell, A. W., Marx, D. T., Pei, Shiyou, and Jorgensen, J. D., Phys. Rev. B 44 (17), 9547–9555 (1991).Google Scholar
13. Schweinfurth, R. A., Platt, C. E., Teepe, M. R., Van Harlingen, D. J., in preparation.Google Scholar
14. Chang, L. D., Moskowitz, M. J., Hammond, R. B., Eddy, M. M., Olson, W. L., Casavant, D. D., Smith, E. J., Robinson, M., Drabeck, L. and Gruner, G., Appl. Phys. Lett. 55 (13), 1357–1359 (1989).Google Scholar
15. Hammond, R. B., Negrete, G. V., Bourne, L. C., Strother, D. D., Cardona, A. H., and Eddy, M. M., Appl. Phys. Lett. 57 (8), 825–827 (1990).Google Scholar