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Progress in Cdl-xZnxTe (CZT) Radiation Detectors

Published online by Cambridge University Press:  21 February 2011

J. F. Butler
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
F. P. Doty
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
B. Apotovsky
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
S. J. Friesenhahn
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
C. Lingren
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
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Abstract

Results of a program to improve the performance of Cd1-xZnxTe detectors by adjusting growth parameters to achieve low-strain, high purity low defect crystals, investigating surface effect phenomena and contacting methods, and establishing reproducible manufacturing methods are reviewed and discussed. Processing and fabrication methods were developed which are applicable throughout the composition range. Energy spectra for room temperature Cdl-xZnxTe detectors exhibit resolutions (FWHM) from 2.16 keV at 14 keV to 6.9 keV at 122 keV. An energy resolution of 910 eV at 5.9 keV was achieved at −25 C. Stable ohmic contacts and gamma ray detection for ZnTe are reported for the first time. Applications of Cdl-xZnxTe to nuclear medicine and X-ray fluorescence are discussed. New gamma ray imagers using Cd1-xZnxTe detector arrays are described, and imaging data for a 32 × 32 monolithic array of 1 mm2 elements on a 42mm × 42mm substrate are presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

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