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Preprocessing of Ion Microtomography Data for Improved Reconstruction Quality

Published online by Cambridge University Press:  22 February 2011

David L. Weirup ,
Arthur E. Pontau ,
Arlyn J. Antolak ,
Dan H. Morse ,
G. Bench ,
M. Cholewa ,
A. Saint  and
G.J.F. Legge
David L. Weirup
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
Arthur E. Pontau
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
Arlyn J. Antolak
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
Dan H. Morse
Affiliation:
Sandia National Laboratories, Livermore, CA 94551
G. Bench
Affiliation:
Micro Analytical Research Centre, University of Melbourne, Melbourne, Australia
M. Cholewa
Affiliation:
Micro Analytical Research Centre, University of Melbourne, Melbourne, Australia
A. Saint
Affiliation:
Micro Analytical Research Centre, University of Melbourne, Melbourne, Australia
G.J.F. Legge
Affiliation:
Micro Analytical Research Centre, University of Melbourne, Melbourne, Australia
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Abstract

In Ion Microtomography (IMT), material densities are determined from the energy lost by ions as they pass through a specimen. For fine-scale measurements with micron-size beams, mechanical stability and precision of motion can impact the quality of the reconstruction. We describe several preprocessing procedures used to minimize imperfect specimen manipulation, including adjustment of the center of mass motion in sinograms and correction for vertical translations. In addition, the amount of noise in the reconstruction is reduced by utilizing median (as opposed to mean) ion energy loss values for density determinations. Furthermore, particular portions of the sampled image can be enhanced with minimal degradation of spatial resolution by a judicial choice of spatial filter in the reconstruction algorithm. The benefits and limitations of these preprocessing techniques are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 217: Symposium U – Advanced Tomographic Imaging Methods for the Analysis of Materials , 1990 , 143
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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