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Practical Realization of Apertureless Scanning Near-field Optical Microscopy Using Hybrid Mode Atomic Force Microscopy

Published online by Cambridge University Press:  16 March 2015

Sergey Zayats ,
John Alexander ,
Sergei Magonov  and
Dmitry Kazantsev
Sergey Zayats
Affiliation:
NT-MDT Development Inc. 7910 S. Kyrene Rd. Tempe 85284 USA Moscow Institute of Physics and Technology, 9 Institutskiy per., Dolgoprudny, Moscow Region, 141700, Russia
John Alexander
Affiliation:
NT-MDT Development Inc. 7910 S. Kyrene Rd. Tempe 85284 USA
Sergei Magonov
Affiliation:
NT-MDT Development Inc. 7910 S. Kyrene Rd. Tempe 85284 USA
Dmitry Kazantsev
Affiliation:
Institute for Theoretical and Experimental Physics, 25 Bolshaya Cheremushkinskaya Str., Moscow 117218, Russia
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Abstract

The local detection of optical response at the sub-wavelength scale on a materials’ surface is an invaluable characterization capability of apertureless scanning near-field optical microscopy (ASNOM). The technique is traditionally realized in amplitude modulation (AM) AFM mode. We have expanded this method by employing an alternative scheme for the detection of the near-field and far-field responses with the use of Hybrid (HD) AFM mode. In HD mode the sample is brought to the intermittent contact with the tip in a periodic oscillation at a frequency (1-2 kHz) much smaller than the probe resonance. In every oscillation cycle the probe deflection to a set-point value is used for surface profiling. For optical measurements the metal coated AFM tip was top-illuminated by visible laser. Simultaneously with surface profiling the light scattered from tip-sample junction was collected by a sensitive photomultiplier (PMT). The homodyne optical signal detection scheme was applied to discriminate near- and far-field optical components. Our method was verified by the studies of various materials (semiconductors, metals, polymers, etc.). The presented results show that the contrast of ASNOM images can be used for compositional mapping of heterogeneous systems.

Keywords

scanning probe microscopy (SPM)optical propertieschemical composition
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1754: Symposium OO/PP/QQ/TT – State-of-the-Art Developments in Materials Characterization , 2015 , pp. 97 - 102
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Zenhausern, F., O’Boyle, M. P., and Wickramasinghe, H. K., “Apertureless near-field optical microscope,” Applied Physics Letters 65, 1623–1625 (1994).CrossRefGoogle Scholar
Zenhausern, F., Martin, Y., and Wickramasinghe, H. K., “Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution,” Science 269, 1083–1085 (1995).CrossRefGoogle ScholarPubMed
Martin, Y., Zenhausern, F., and Wickramasinghe, H. K., “Scattering spectroscopy of molecules at nanometer resolution,” Applied Physics Letters 68, 2475–2477 (1996).CrossRefGoogle Scholar
Knoll, B., Keilmann, F., Kramer, A., and Guckenberger, R., “Contrast of microwave near-field microscopy,” Applied Physics Letters 70, 2667–2669 (1997).CrossRefGoogle Scholar
Hillenbrand, R., Knoll, B., and Keilmann, F., “Pure optical contrast in scattering-type scanning near-field microscopy,” Journal of Microscopy 202, 77–83 (2001).CrossRefGoogle ScholarPubMed
Knoll, B. and Keilmann, F., “Near-field probing of vibrational absorption for chemical microscopy,” Nature 399, 134–137 (1999).CrossRefGoogle Scholar
Wurtz, G., Bachelot, R., and Royer, P., “A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope,” Review of Scientific Instruments 69, 1735–1743 (1998).CrossRefGoogle Scholar
Brehm, Markus, Frey, Heinrich G., Guckenberger, Reinhard, Hillenbrand, Rainer,Kazantsev, Dimitri, Keilmann, Fritz, Ocelic, Nenad and Taubner, Thomas, “Consolidating Apertureless SNOM”, Journal of the Korean Physical Society, Vol. 47, August 2005, pp. S80↑ S85Google Scholar
Brehm, M., Taubner, T., Hillenbrand, R., and Keilmann, F., “Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution,” Nano Letters 6, 13071310 (2006).CrossRefGoogle ScholarPubMed
Keilmann, Fritz, Huber, Andreas J., Hillenbrand, Rainer, “Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains”, J Infrared Milli Terahz Waves (2009) 30:1255–1268 Google Scholar
Huber, Andreas J., Kazantsev, Dmitry, Keilmann, Fritz, Wittborn, Jesper and Hillenbrand, Rainer, “Simultaneous IR Material Recognition and Conductivity Mapping by Nanoscale Near-Field Microscopy”, Advanced Materials, 19, 2209–2212 (2007)CrossRefGoogle Scholar
Labardi, M., Patan`e, S., and Allegrini, M., “Artifact-free near-field optical imaging by apertureless microscopy,” Applied Physics Letters 77, 621–623 (2000).CrossRefGoogle Scholar
Novotny, L. and van Hulst, N., “Antennas for light,” Nature Photonics 5, 83–90 (2011).CrossRefGoogle Scholar
Esteban, R., Vogelgesang, R., Dorfmüller, J., Dmitriev, A., Rockstuhl, C., Etrich, C., and Kern, K., “Direct near-field optical imaging of higher order plasmonic resonances,” Nano Letters 8, 3155–3159 (2008).CrossRefGoogle ScholarPubMed
Stiegler, J. M., Abate, Y., Cvitkovic, A., Romanyuk, Y. E., Huber, A. J., Leone, S. R., and Hillenbrand, R., “Nanoscale infrared absorption spectroscopy of individual nanoparticles enabled by scattering-type near-field microscopy,” ACS Nano 5, 6494–6499 (2011).CrossRefGoogle ScholarPubMed
Esslinger, M., Dorfm¨uller, J., Khunsin, W., Vogelgesang, R., and Kern, K., “Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy,” Review of Scientific Instruments 83, 033704 (2012).CrossRefGoogle ScholarPubMed
Maghelli, N., Labardi, M., Patan`e, S., Irrera, F., and Allegrini, M., “Optical near-field harmonic demodulation in apertureless microscopy,” Journal of Microscopy 202, 84–93 (2001).CrossRefGoogle ScholarPubMed
Bek, A., Vogelgesang, R., and Kern, K., “Apertureless scanning near field optical microscope with sub-10 nm resolution,” Review of Scientific Instruments 77, 043703 (2006).CrossRefGoogle Scholar
Taubner, T., Hillenbrand, R. and Keilmann, F., “Performance of visible and mid-infrared scattering-type near-field optical microscopy”, Journal of Microscopy, Vol. 210, Pt 3 June 2003, pp. 311–314.CrossRefGoogle Scholar