Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-28T22:17:43.827Z Has data issue: false hasContentIssue false

Post-etch treatment enabled electroless copper metallization of porous dielectric

Published online by Cambridge University Press:  29 May 2013

Yezdi N. Dordi*
Affiliation:
Lam Research Corp., 4400 Cushing Parkway Fremont, CA 94538, U.S.A.
Get access

Abstract

This paper describes an alternate two-step metallization scheme for porous dielectrics. The patterned dielectric surface is first treated in a plasma etch chamber where the dielectric surface is coated with a very thin carbon-based film. This is followed by electroless copper deposition. The plasma post-etch treatment (PET) film seals the pores of the dielectric, minimizes dielectric damage, and functionalizes the dielectric to enable electroless plating.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Yoshino, M., Masuda, T., Yokoshima, T., Sasano, J., Shacham-Diamand, Y., Matsuda, I., Osaka, T., Hagiwara, Y., and Sato, I., Journal of the Electrochemical Society 154(3) (2007), D122D125 CrossRefGoogle Scholar
Charbonnier, M. and Romand, M., International Journal of Adhesion and Adhesives. 23 (2003) 277285 CrossRefGoogle Scholar
Xie, Q., Jiang, Y., Musschoot, J., Deduytsche, D., Detavernier, C., Van Meirhaeghe, R., Van den Berghe, S., Ru, G., Li, B., Qu, X., Thin Solid Films 517 (2009) 46894693 CrossRefGoogle Scholar